Used Metrology and inspection equipment
1,182 results<b>1x KLA TENCOR, RS35, PROMETRIX Description</b> Resistivity Measurement Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x Semix/Tazmo, TR6133UD, Inspection Equipment Description</b> Configuration 150mm - dual Indexers Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Semix/Tazmo <b>1x Semix/Tazmo, TR6132U, Inspection Description</b> Configuration 150mm Condition/Warr Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x Waferworx, 53-450000-001, Inspection Description</b> Configuration 200mm and has Olympus Mdl MX80-F Mic Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Veeco Model: 1001 ION MILL Specifications • Used • Description Ion Mill • Configuration 10" Ion Mill ( Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Leybold Model: U1100 Plus LEAK DETECTOR Specifications • Used • Description Leak Detector Location : AMERICA North (USA-Canada-Mexico)
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More detailsManufacturer KLA-Tencor Model 8100E Description: CD SEM Configuration: 8" setup Location : AMERICA North (USA-Canada-Mexico)
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More details<font face="arial"><small><b>MANUFACTURE: </b> Thermawave <b>MODEL/TYPE#: </b> OP2600 ▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬ < Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-ray is in perfect condition Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details– Running machine – Includes software Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsPre Reflow and Post Reflow High-Speed Camera, 12MP CMOS Camera Patented - Next Generation 3D Model Processing, Location : AMERICA North (USA-Canada-Mexico)
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More detailsAtis Co. Ltd. AU Etch Station looks to be in good cosmetic condition, showing some signs of wear. However, I Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA Model: 1007-47 SEMI-AUTOMATIC WAFER PROBER SYSTEM Specifications - Used - Semi-Automatic Wafer Pro Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection Year(s) : 2016 Location : -
Price : On request
More detailsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: Load locked single wafer sputter, cassette to cassette vertically mounted for sideways spu Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Magnetron sputtering system configured for 4" wafers, System is fully automated, cassette-to-cass Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm thickness measurement systems. Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: • For Etching and lithography process control • Highly stable scanning micro densitometer desi Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurfscan Specifications: 4", 6" and 8" compatible Location : AMERICA North (USA-Canada-Mexico)
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More details– Software – Dongle Xray fluorescence spectrometer Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Specification Wafer Size: 200MM Wafer Shape: SNNF (Semi Notch No Flat) Wafer : 6”, 8” or 12” Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFacilities: 110 VAC 1ph, 50/60Hz, 15amps / 80 psi, 2 CFM Dims: 59" x 66" x 63" @ 5,500 lbs offers complete ins Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsZeiss Trinocular Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x, Dektak, IIA (Sloan) Surface Profile Measuring System</b> Surface Profile Measuring System, Capability Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.