Used Metrology and inspection equipment
1,680 resultsEquipped with Prelens ion Column SFEG UHR SEM 5 axis stage with 200 x 200 mm XY Load lock loading Turbo vacuum Location : AMERICA North (USA-Canada-Mexico)
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More detailsEquipped with 200KV, Schottky FEG emitter SuperTWIN lens. Beautiful and high performer! It includes single ti Location : AMERICA North (USA-Canada-Mexico)
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More detailssoftware package: Magnum Column SFEG UHR SEM 300mm wafers and 200 Flexilock loading FOUP loading Bridge tool f Location : AMERICA North (USA-Canada-Mexico)
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More detailsA single tilt holder SE mode TMP vacuum Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures a S-TWIN pole piece Analytical setup – STEM Operates up to 200KV and comes with a single tilt holder; Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
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More detailsIs equipped with 120KV, W or LaB6, BIOTwin lens Compustage, and a s ingle tilt holder Install and custom confi Location : AMERICA North (USA-Canada-Mexico)
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More detailsIs equipped with Tungsten emitter, High and Low vacuum 100x50mm XY, and ODP vacuum. Install and custom configu Location : AMERICA North (USA-Canada-Mexico)
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More detailsInlcudes FEG SEM Ultra high resolution Modern, capable Easy to use Drawer and LL entry Location : AMERICA North (USA-Canada-Mexico)
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More detailsThis remanufactured SEM for sale has superior imaging capability This remanufactured SEM for sale is ready to Location : AMERICA North (USA-Canada-Mexico)
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More detailsXray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> ・Controller: IM-6600 ・Measuring head: IM-6120 ・Photograph element: 6.6 million pixels C Location : ASIA (North East)
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More details<b> specification </b> ・Controller: IM-6500 ・Measuring head: IM-6010 ・Photograph element: 6.6 million pixel mo Location : ASIA (North East)
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More details【specification】 ・Measuring head/controller: VR-3200/VR-3000 ・Observation mode: Wide field of view (12, 25, 38, Location : ASIA (North East)
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More details○Main specifications ・Stage movement: X axis 200mm, Y axis 200mm, θ axis ±5° ・Microscope stage movement: X axi Location : ASIA (North East)
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More details【specification】 Observation method Epi-illumination: bright field, dark field, differential interference Sta Location : ASIA (North East)
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More detailsMeasurement target Seebeck coefficient Thermal conductivity (evaluate thermal conductivity by comparison with Year(s) : 2017 Location : ASIA (North East)
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More detailsUltra Microtome 【specification】 ・Section thickness setting range: 1nm to 15000nm ・Total sample feeding amoun Location : ASIA (North East)
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More details【specification】 ・Controller: IM-6700 ・Measuring head: IM-6125 ・Photograph element: 6.6 million pixels monochro Location : ASIA (North East)
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More detailsImage dimension measuring instrument 【specification】 ・Controller: IM-6600 ・Measuring head: IM-6140 (high prec Location : ASIA (North East)
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More details<b> Specification </b> Monitor 23-inch full HD (1920 x 1080 pixels) LCD monitor with 3D display function Photo Location : ASIA (North East)
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More details6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)
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More detailsTILTING PLATEN, 5X5″ TRAVEL, WITH 6″ DIAMETER CHUCK INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO Location : AMERICA North (USA-Canada-Mexico)
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More detailsOS: Windows 10 High Efficiency Preheater: 24" x 16" (7500 watts) Board Carrier: 24" x 16" Topside Clearance: Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Acoustic Microscope Version: Laboratory Vintage: 01.06.2010 A high-speed scanning acoustic microscope Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCompound Microscope Microscope Configuration Brightfield & Darkfield Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.