Used Metrology and inspection equipment
1,680 resultsUnpatterned Wafer Surface Inspection Tool Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsObservation method Transmission: bright field Epi-illumination: bright field, dark field, high intensity (UV) Location : ASIA (North East)
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More details6″ Probe station With 6″ chuck and 6X6″ travel Manual lifting platen, Z movement controlled by chuck Microzoom Location : AMERICA North (USA-Canada-Mexico)
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More detailsCR TECH CRX-1000 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel Argos YOM 2004 Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsBinocular Angle 45° Eyepieces Model 445111 Magnification 10 X Field Number 21 mm Focusing YES T Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel M7A-DiscussionScope Binocular Angle 45°-Low Eyelevel Eyepieces Magnification 10 X Field Number Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 10 X Field Number 21 mm Focusing YES Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand Omniphysics ○Main specifications ・Stage movement: X200mm, Y200mm ・Substage movement amount: X13mm, Y13m Location : ASIA (North East)
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More detailsMicromanipulator System [Configuration/Specifications] ・Manipulator (left and right arms): Operating ran Location : ASIA (North East)
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More detailsMonitor Color LCD TFT 15 type 3D display function Hybrid DFD method Image capturing element (CCD) 2.11 million Location : ASIA (North East)
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More detailsMicroscope Digital Camera 【Main Specifications】 〇Control unit (DIGITAL SIGHT DS-L2) ・Brightness: 350cd/㎡ ・Sto Location : ASIA (North East)
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More detailsSystem Stereo Microscope Total magnification: 11.25x to 112.5x Body zoom: 0.75x ~ 7.5x Eyepiece: UW10x/24 Obj Location : ASIA (North East)
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More detailsProcessed material: 30 x 70 mm or 60 x 70 mm Pyrex Processing amount: 1 jig / batch Heating temperature: MAX 9 Year(s) : 2003 Location : ASIA (North East)
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More detailsBrand XRADIA Microscope Zeiss 150 KV 10 Watt tube Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : JUN 2012 In-Line AOI 208-240V 1 Phase Specifications With over 17,000 systems installed throughou Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel type: Type2/103 (tip tip nominal diameter φ30μm) Measurement range: UMAP 185 x Y200 x Z175mm Image probe Location : ASIA (North East)
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More details-AXIS Active Image Stabilisation -XiDAT 2.0 imaging chain -Up to 70 degree oblique angle views over the entire Location : AMERICA North (USA-Canada-Mexico)
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More detailsHITACHI CG4100, 300mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHg-CV measurement system Version: up to 12 inch Vintage: 01.01.2004 - Capable up to 12" Wafer - SSM 52 Capac Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsULTRATECH LSA100A, s/n: 6125, 300mm Location : AMERICA North (USA-Canada-Mexico)
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More details8″ uv flood exposure system, cassette to cassette. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Trinoc Location : AMERICA North (USA-Canada-Mexico)
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More detailsOEM SAT Spray Acid Etch Tool Version: Clamshell Automatic Shut down in Fab. Needs to be removed in the next f Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.