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Used Metrology and inspection equipment

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1

<b>1x, A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Doubl Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor Surfscan 7600 Particle Inspection System</b> A particle inspection tool - capable of up to Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor 6100 Surfscan Analysis System</b> Unpatterned wafer surface contamination analyzer Feature Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor, CRS1010 UltraPointe Defect Review Station</b> Specifications: 200mm / 8inch capabilities. Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, Veeco Dektak 3ST Surface Profiler</b> Surface profile measuring system. Specifications: Step Height M Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor AIT I In-Line Defect Inspection System</b> Automated full water inspection system for dete Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor, FLX-2300 FleXus </b> Thin-film stress measurement instrument that measures the changes in Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor, 5500 Surface Particle Inspection Analyzer</b> Features: Handles high scattering surfaces s Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor P-2 Long Scan Profilometer</b> High sensitivity, long scan surface profiler measuring rough Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor P-10 Surface Profiler</b> A computerized, highly sensitive surface profiler that measures r Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor FleXus FLX 2320</b> Thin-film stress measurement instrument that measures the changes in t Location : AMERICA North (USA-Canada-Mexico)

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<b>1x, KLA-Tencor 2131 Defect Inspection System</b> The KLA-Tencor 2132 is a wafer defect inspection system. Location : AMERICA North (USA-Canada-Mexico)

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Model: RTE 221 Refrigerated Bath/Circulator Used Details: Analog control Temp. Range: -23 to +100 deg C Bath Location : AMERICA North (USA-Canada-Mexico)

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Model: RTE 140 Refrigerated Bath / Circulator Used Details: Digital Controller Temperature range -40c to =150 Location : AMERICA North (USA-Canada-Mexico)

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Model: Plasma-Therm Dual Chamber PECVD & RIE System Used Details: The 790 platform offered in both RIE and P Location : AMERICA North (USA-Canada-Mexico)

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Brand: Neslab Model: RTE 140 Refrigerated Bath / Circulator Used Details: Digital Controller Temperature ran Location : AMERICA North (USA-Canada-Mexico)

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Brand: Nikon Model: Optiphot 200D Microscope with MicroMetric Microline 300 Used Details: 10X, 50X, 100X 6 Location : AMERICA North (USA-Canada-Mexico)

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Description: HRP (High Resolution Profiler) series from KLA-Tencor provides a comprehensive automated surface Location : AMERICA North (USA-Canada-Mexico)

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Brand: KLA-Tencor Model: UV-1070, Thin Film Measurement System Used Details: Refurbished to meet OEM Specifi Location : AMERICA North (USA-Canada-Mexico)

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Brand: KLA-Tencor Model: AIT XP Darkfield Inspection System Used Details: The KLA-Tencor AIT XP+ Patterned W Location : AMERICA North (USA-Canada-Mexico)

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Brand: Rudolph Research Model: Auto EL IV Ellipsometer The AutoEl IV has automatic 3 wavelength operation and Location : AMERICA North (USA-Canada-Mexico)

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Brand: Dektak Model: 3030, Surface Profiler Measures vertical features ranging in height from 131 micron to 5 Location : AMERICA North (USA-Canada-Mexico)

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<font face="arial"><small><b>MANUFACTURE: </b> Estek <b>MODEL/TYPE#: </b> WIS 8000/800 ▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬ Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 8 Year(s) : 1997 Location : ASIA (North East)

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Fully refurbished to like-new condition, including 1 year warranty, professional installation, and also proce Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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