Used Metrology and inspection equipment
1,182 resultsCamera and Optics: Review camera CCD : 3CCD Color Review camera Resolution : 752pixels*582 lines Second Camera Location : EUROPE (Western and Northern)
Price : On request
More details- Manual Mask Aligner - Topside Alignment (TSA) - Automatic Alignment - Up to 6"/150mm Wafer Capable (with pro Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Long Scan Surface Profilometer - Wafer Size: 8"/200mm - S/N: 1090-0420 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWe can provide 2 sets of Alpha 8S. One is complete and another with some missing parts Location : ASIA (North East)
Price : On request
More detailsPrinted Circuit Board Manufacturing Location : EUROPE (Western and Northern)
Price : On request
More detailsMicroscope : - Model :OLYMPUS MX50A-F - Objectives :5X,10X,20X,50X,150X Motorize objectives 2. Autoloader Location : ASIA (North East)
Price : On request
More detailsFeatures: Non-contact Low cost All-electronic gaging Fast set-up Easy operation Thickn Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKH-8030 In-line 3D Solder Paste Inspection System Year(s) : 2008, 2010 Location : EUROPE (Western and Northern)
Price : On request
More detailsDescription: Auto Mapping System. Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: Non-contact Accurate Digital display Temperature compensation High or Low Resist Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: Non-contact Accurate Digital display Wide operating range ASTM standard Thic Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDescription: 300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpecifications: Stylus:12.5 um radius (Diamond) Scan Range: x:50 um - 50mm; z: 100 A - 131 um z R Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOther V 48.0 A 50/60 Hz Exterior Dimensions Width 169.528 in (430.6 cm) Depth 61.890 in (1 Year(s) : 2012 Location : EUROPE (Western and Northern)
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More detailsHigh Speed XRay System f. Tray Handling Accessories input Feeder output feeder Power Requirements Other V Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More details– 3 Bulb Unit – Exhaust Blower Included UV Curer Location : AMERICA North (USA-Canada-Mexico)
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More detailsExposure Unit Model Accutray AT-38 Location : AMERICA North (USA-Canada-Mexico)
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More details– 4 Camera – Water Cooled – 8 kw Exposure Unit Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm Punch Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Up to 8"/200mm wafer capable - Computer controlled - Measures roughness, waviness, step height, and other su Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details220 VAC Serial #17051 Installation included Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsS139226 ESI Accuscribe 2600 Laser Wafer Scriber w/ Panasonic Loader Depth (in inches) 66 Width (in inches) 9 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsC113239 Veeco Dektak SXM Atomic Force Microscope, Equipe Robots, 8" Wafer Chuck Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x KLA TENCOR, Alphastep 200, PROMETRIX Description</b> Profilometer Condition/WarrantyAs-is, where-is Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x KLA TENCOR, SM300, PROMETRIX Description</b> Film Thickness Spectramap Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.