Used Metrology and inspection equipment
1,182 resultsBrand: Superior Electronics Model: AFPP-500 FULLY AUTOMATIC 4 POINT PROBE Specifications • Used • Fully Autom Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: KLA-Tencor Model: Surfscan SP1-DLS WAFER SURFACE ANALYSIS SYSTEM Specifications • Used • 0.050um Defec Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: Alpha Step 500 PROFILOMETER Specifications • Used • Computer controlled Scanning and Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: ADE Model: UltraGage 9500 MEASUREMENT SYSTEM Specifications • Used • Thickness - centerpoint, five poi Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Rudolph Research Model: FE-III FOCUS ELLIPSOMETER Specifications • Used • Class 1 filtered wafer envir Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: Surfscan 6400 FILM SURFACE ANALYSIS SYSTEM Specifications • Used • Measures surface Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpin Rinse Dryer Location : AMERICA North (USA-Canada-Mexico)
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More detailsPower: 110VAC ( 220 optional ) 50/60 Hz, 15 amps Air input: 30 PSI min., 1/4 air hose Footprint: 55” x 57” x 5 Location : AMERICA North (USA-Canada-Mexico)
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More details8 Inch SRD Manual included Location : EUROPE (Western and Northern)
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More detailsmicropositioner with vacuum base 12C Picoprobe with power supply Location : AMERICA North (USA-Canada-Mexico)
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More detailsProbe: 100mm tip spacing, 60+ grams force, Tungsten Carbide, Tip Ru 100 (100 microns tip radius) 200mm vacuum Location : AMERICA North (USA-Canada-Mexico)
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More details6" stainless steel vacuum chuck Olympus SZX7 Stereozoom microscope with camera port and fiber ring illuminator Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeature resolution 3um Travel range X/Y/ZÂ 12.5mm/12.5mm/12.5mm Magnetic base with quick release lever Location : AMERICA North (USA-Canada-Mexico)
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More details4" vacuum chuck Mitutoyo microscope with 2x/10x/20x objectives Optional: positioners Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection Machine. Input: 200-240 50/60 Hz. Single phase. Good Working Condition. Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFTIR System Version: 200 mm Vintage: 01.06.2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFixed Rail: Front OEM: Viscom Transfer Direction: Left to Right Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsJUTZE 3D Inline PCB Thickness: 0.6mm - 6.0mm PCB Measurements: 50mm x 70mm - 510mm x 460mm Weight: 777Kg Mach Location : EUROPE (Western and Northern)
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More detailsRework System Year(s) : 2018 Location : -
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More detailsIR-4 Preheater 208VAC 20Amp 50/60Hz Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details- Spray Acid Tool (SAT) - Single Chamber - Up to 6"/150mm capable - Capacity: Single 25-Wafer Cassette, 150mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsEllipsometer system, X-ray, with CFT75A2 chiller Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Manual Alignment - Up to 6"/150mm Wafer Capable (with proper Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDual Band Visible IR Heating System 150W Lens Focused with adjustable image system Supplied with 2 lenses Comp Year(s) : 2012 Location : EUROPE (Western and Northern)
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More detailsVoltage: 115 Single lane Operating System Windows 2000 Vision 2007 Ver 4.8 program Manual - soft copy on machi Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.