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Used Metrology and inspection equipment

1,182 results
1

Mitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck Location : AMERICA North (USA-Canada-Mexico)

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100mm wafer vacuum chuck B&L 7 stereozoom with coax illumination 2 R&K micropositioners Location : AMERICA North (USA-Canada-Mexico)

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Elec: Probe card inspection Location : ASIA (North East)

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5150 Description Elec: Probe card inspection Location : ASIA (North East)

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5200 Description Elec: Probe card inspection Location : ASIA (North East)

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I-20 MI-SCOPE-120 Description Other: Ultrasonic scan analyzer Location : ASIA (North East)

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DMP-3000 fluid deposition printer with 300mm x 300mm print area and positional accuracy of 5um Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Inspect-X Software X.Tract – Create 3D X-Ray Model 2D X-Ray 160kV Open Tube X-Ray Automated Inspection 20W (be Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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High Performance 8mm Camera System Max Board 20"x18" Paste print, pre-, post-reflow and THT solder joint inspe Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Five Camera In-Line AOI System 10 MP cameras with ISIS Vision 13.4 micron um/pixel TELECENTRIC COMPOUND lenses Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

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Small Footprint Min/Max Board Size: 2 x 2.4 to 10 x 13 in PCB Clearance: Top: 40 mm, 1.57 in., Bottom: 40 mm, Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Single side inspection, 18 micro meter resolution Can be reconfigured for conformal coating inspection. Board Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Very Low Use! 3D Solder Paste Inspection System 100% 3D Paste Measurement based on the patented Shadow-Free me Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick a Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Post Reflow, Post Paste and Post Wave High Resolution Telecentric optics 75 Megapixels per second 5 MP Color C Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Macro Inspection System Version: 300 mm Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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Laser particle counter Year(s) : 1989 Location : ASIA (North East)

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UMA-802-HC551NY Description UV cure Year(s) : 1995 Location : ASIA (North East)

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SCW-622-B Description SOG coater Year(s) : 1991 Location : ASIA (North East)

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Resist stripping system (organic solvent) Year(s) : 1984 Location : ASIA (North East)

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3030VAL SPI Vintage: 11/2007 3D Vision SMEMA conveyor with Bottom Up Side Edge Clamping Measures: Volume, Heig Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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160kV Open Tube (Filaments) Nano Focus X-Ray Tube 1200X Geometric Magnification Imaging System: Quality Assist Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Three Layer Programmable LED Light Source Min PCB: 2”x 2” Max PCB: 26"x 24" Pre And Post Reflow Inspection Cap Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Repair Station, Type Veri Smart VRL-OL Year(s) : 2006 Location : EUROPE (Western and Northern)

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E 2000 HT 300-4 Description: Diffusion Furnace Version: Solar Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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