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Used Metrology and inspection equipment

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1

(Was an XD7500 converted to a XD7600-NT-250 sealed tube system by Dage) 160kV Max. Board Size: 508 x 444mm Max Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Lightly Used Inline AOI Large Board: 21”x21” Max Inspection Area: 21”x21” Min Inspection Area: 2”x2” Linear Mo Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Inline System 3 Stage Conveyor Max board: 20" x 18" 5 Camera System 10 Mega Pixel Digital Color Camera Precisi Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Five Camera In-Line AOI System Side Viewer System (4x angled cameras) Ultra High Resolution Camera High Resolu Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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Standalone 5 Mega Pixel Side View Camera System (upgrade) 5 Mega Pixel @ 13.4 ,um/pixel (precision tele-centri Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Five Camera In-Line AOI System 10 MP cameras with ISIS Vision 13.4 micron um/pixel TELECENTRIC COMPOUND lenses Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

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Small Footprint Min/Max Board Size: 2 x 2.4 to 10 x 13 in PCB Clearance: Top: 40 mm, 1.57 in., Bottom: 40 mm, Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Single side inspection, 18 micro meter resolution Can be reconfigured for conformal coating inspection. Board Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick a Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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160kV Open Tube (Filaments) Nano Focus X-Ray Tube 1200X Geometric Magnification Imaging System: Quality Assist Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Lead Free Capable Site cleaning feature 9 micron placement accuracy (0.0003”) @ 3 Sigma High volume rework Ult Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Full 3D inspection 19.5x19.5” (500x500mm) max board size capability CMOS camera 16 μm per pixel resolution (sc Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Three Heating Zones Cooling Zone Auto Profiling Semi-Automation Process Vision Alignment Max Board 20" x 23.5" Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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PCB Size supported: From L50mm x W 50mm to L460mm x W360mm Inspection time: 0.2sec / inspection area Year(s) : 2006 Location : ASIA (South East)

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60A Spin/Expose/Develop Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

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80 B Coat/Track 56700-3354 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

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Wafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)

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Spectroscopic ellipsometry: Measures the change in polarization state of light reflected from a sample to de Location : AMERICA North (USA-Canada-Mexico)

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Bare Wafer Surface Defect Inspection System Max Wafer Capable: 8”/200mm System configured for 8“/200mm wafers Location : AMERICA North (USA-Canada-Mexico)

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Capable of 2" - 8" wafers Low angle optics Non-Patterned surface Inspection System 0.10 micron Defect Sensitiv Location : AMERICA North (USA-Canada-Mexico)

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It features a dual-laser profilometer, an optical inspection module, and an imaging acquisition machine. Th Location : AMERICA North (USA-Canada-Mexico)

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Not only does the KLA ADE Tencor Ultragage 9500 offer exceptional accuracy and versatility, but it also boas Location : AMERICA North (USA-Canada-Mexico)

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Our Particle Deposition System SST-1500is the only tool in the semiconductor industry that produces the high Location : AMERICA North (USA-Canada-Mexico)

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[Specifications] ○Measurement unit: XM-1200 ○Controller: XM-1500 ○Measurement range: 600mm x 300mm x 200mm ○Im Location : ASIA (North East)

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Mask Aligner With 150mm Backside Chuck Cassette to Cassette 1000 Watt Light Source Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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