Used Metrology and inspection equipment
1,680 resultsWorking condition before deinstall Location : EUROPE (Western and Northern)
Price : On request
More detailsVeeco Wyko NT3300 Non contact Profilometer Fully Refurbished New PC with latest Wyko software revision running Location : EUROPE (Western and Northern)
Price : On request
More detailsRUDOLPH / AUGUST WAFER INSPECTION SYSTEM MODEL: NSX-105c VINTAGE: 2006 Automatic Wafer Inspection System up t Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsWafer Size 200mm Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsComplete Unit Model:340 Location : EUROPE (Western and Northern)
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More detailseS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent qua Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsCurrently Under KLA Service Contract. Location : EUROPE (Western and Northern)
Price : On request
More detailsas is where is in fab running Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsVintage : 2004. HDDs included, please see the photos. Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsModel: SEM Vision cX OEM: AMAT Accessory: 1 Baking Box, 1 User Manual Condition at Time of Shutdown: Operated Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsdouble rail; CPK2.6; 30 type camera--4pcs; nozzle--48pcs Year(s) : 2012 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection microscope with reflected and transmitted illumination Reflected and transmitted light 5x/10x/20x/5 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)
Price : On request
More detailsCondition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsNikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)
Price : On request
More detailsX-Ray Inspection System Model XD7600NT Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer inspection system WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System Model 7555.0 Location : EUROPE (Western and Northern)
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More detailsThe KLA is complete and refurbished in 2015. No known condition issues. Year(s) : 1992 Location : EUROPE (Western and Northern)
Price : On request
More details3 Ports: 200 mm / 300 mm Refurbished Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomatic Defect Inspection Machine Model NSX 95 Location : EUROPE (Western and Northern)
Price : On request
More detailsParts machine 2008 Vintage Model NSX 105 Inspection System, 8" Year(s) : 2008 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System SFS7700 Used condition, recently came out from the working Environment. Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection system Brand Nanotronics Imaging Inc. Model nSPEC Year(s) : 2018 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage 2014 Condition: excellent CE marked Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.