Used Metrology and inspection equipment
1,680 resultsProcess: Thin Film Stress Measurement System Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsconsole with keypad controller Free angle stand with manual X,Y,Z and theta rotation of stage Zoom lens 150-8 Location : EUROPE (Western and Northern)
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More detailsPhotoresist Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsSDP-ALD NIT 12 Thin Film ALD SiN/SiO Wafer Size 12 Location : EUROPE (Western and Northern)
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More detailsIPS AKRA CVD Ti/TiN Year(s) : 2010 Location : EUROPE (Western and Northern)
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More detailsProcess: Thin Film Stress Measurement System Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsFixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial Location : EUROPE (Western and Northern)
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More detailsWAFER SIZE 8 Location : EUROPE (Western and Northern)
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More detailsTENCOR Surfscan 4500 Wafer surface inspection Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafer Location : EUROPE (Western and Northern)
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More detailsCamera and Optics: Review camera CCD : 3CCD Color Review camera Resolution : 752pixels*582 lines Second Camera Location : EUROPE (Western and Northern)
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More detailsPrinted Circuit Board Manufacturing Location : EUROPE (Western and Northern)
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More detailsADE Episcan 1000 FT-IR Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICA Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsMirtec MV-6e Omni 3D AOI- 2016 #17161122-3535 DOM: 11/2016 SW: Mirtec inspector 5.5.400.332 Win 7 Lighting: Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKoh Young 8030-2 3D SPI - 2016 # 01314 DOM: 4/2016 Per the OEM: The KY8030-2 has maintained the industry’s le Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOmron VT-RNS-II Inline AOI Machine 120V Single phase Max board 18x20" Board size : L Good working order M Location : AMERICA North (USA-Canada-Mexico)
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More detailsYESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera, Windows 7 - DOM: 4/2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMirtec MV-3L Benchtop AOI 5 Cameras DOM: 02/2018 Windows 7 - SW: Mirtec Inspector 5.5.400.327 5 Cameras: Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera Windows 7 YesVision V2.8.0 DOM: 6/2013 Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsGE Phoenix Micromex 180 KV PCBA X-ray System DOM: 3/2008 180KVA Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCyberoptics SE600 3D SPI & SQ3000 3D AOI Package - 2020 (1) CyberOptics SE600-II 3D SPI DOM: 12/2019 OS: Wind Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDOM: 12/2019 OS: Windows 10 SW: 5.8.1.11 Came to PFI with VERY low production use. Gauge R&R run & is perfect Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDOM: 12/2019 OS: Windows 10 SW: 5.6.1.175 With: PXS 3d Sensor & MRS Came to PFI with VERY low production use. Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon X-Tek Revolution - Nanotech Xray Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source wi Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNordson Dage XD7500VR Jade FP 160KV X-Ray System DOM : 1/2016 Windows 7 OS Open tube Flat panel detector 20 Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNordson Dage XD7500VR Jade FP 160KV X-Ray System DOM : 7/2015 Open tube Flat panel detector 200-230V 16A Sin Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.