Used Metrology and inspection equipment
1,680 resultsWafer inspection Microscope system Model Mis 8 Location : EUROPE (Western and Northern)
Price : On request
More detailsFurther details in attachment. Equipment/Component Type:High Speed Color AOI Item has scratches and markings Year(s) : 2003 Location : EUROPE (Western and Northern)
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More details- 4mega camera - 20um pixel resolution - 510*460mm Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsRefurbished to OEM Specs Rudolph/August Wafer Inspection System Model:NSX-105C Condition: Good working condit Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsRefurbished with 6 Mnths warranty System has Windows NT System has Dual Spot Optics System has Transformer fo Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsSold As-Is, Where-Is Overall condition is okay but it is missing optical fiber deinstalled and stored Location : EUROPE (Western and Northern)
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More detailsMachine is complete and look to be in good condition Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsSoftware version: 10.2.4.0101 This is a CS900 running CS920 software Tool powers on and initializes Does not h Year(s) : 2017 Location : EUROPE (Western and Northern)
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More detailsWarehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's completer with HDD and So Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsCategory: Metrology Maker: KLA Model: MIS-200 Wafer Size: 200 Process: Inspection Config Review inspection. N Location : EUROPE (Western and Northern)
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More details50Hz/60Hz Missing Parts: Controller PCB cards, Handling Robot and Controller 2005 Vintage Year(s) : 2005 Location : EUROPE (Western and Northern)
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More details- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distan Year(s) : 1997 Location : EUROPE (Western and Northern)
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More detailsParticle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsHitachi WA200 FAB SMIFF interface Wide area scanning probe microscope Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsMetrology Model INS3300 Location : EUROPE (Western and Northern)
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More detailsHitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and Location : EUROPE (Western and Northern)
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More detailsTabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introduct Location : EUROPE (Western and Northern)
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More detailsFilm Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currently Configured for Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsAutomatic Wafer Optical Inspection System Robot defect but machines works fine in manual mode Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsManufacturer ICOS Model WI-2200 + MH 200 AVI_WI-2000+HM200 spec This system is used as a set. Vintage : 2009 Year(s) : 2009 Location : EUROPE (Western and Northern)
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More detailsInspection System Parts Tool Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System 200mm Good Condition Just out from 200mm fab Location : EUROPE (Western and Northern)
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More detailsWafer Inspection Microscope Model MIS200 Location : EUROPE (Western and Northern)
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More detailsMP200 double path tool non copper tool; double path tool delay stage; 6 inch chuck Cooling Water Required Min Year(s) : 2002 Location : EUROPE (Western and Northern)
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More detailsLeica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers. This compa Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.