Used Metrology and inspection equipment
1,680 resultsWafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) Year(s) : 2005 Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 150mm Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsMetrology Model Prometrix UV-1050 Location : EUROPE (Western and Northern)
Price : On request
More detailsIntegrated Metrology System Model 9010bVIS Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsThe NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that provides a br Location : EUROPE (Western and Northern)
Price : On request
More detailsfilm thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objective Location : EUROPE (Western and Northern)
Price : On request
More detailsLong Scan Surface Profilometer Wafer Size: 8"/200mm Note: this tool won’t boot Year(s) : 1990 Location : EUROPE (Western and Northern)
Price : On request
More detailsMetrology Model UV1080 Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer size: 20mm Microscope Location : EUROPE (Western and Northern)
Price : On request
More detailsZeiss 1540 EsB Dual Beam FIB-SEM - EDX is included - 10mm EDAX detector - Known issue with Ion Pump for FIB ca Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-Tencor SP1-TBI Wafer Defect Inspection System | 200mm | AS-IS KLA-Tencor SP1-TBI wafer defect inspection s Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required Location : EUROPE (Western and Northern)
Price : On request
More detailsProber Working condition Vintage circ 1999~2000 MS Dos system EGCommander software Location : EUROPE (Western and Northern)
Price : On request
More detailsNanometrics ECVPro Carrier Concentration Profiler For Si, SiC, II-VI, III-V & III-Nitrides Hamamatsu LC8 UV L Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsProfilometer Controller Type Microprocessor Controller Type Accessories Thermal printer is included Environmen Year(s) : 2017 Location : EUROPE (Western and Northern)
Price : On request
More details300mm inspection microscope for reflected and transmitted light inspection Nikon stage with 12" x 14" XY trave Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsUltra Micro Hardness Tester Model DUH 202 Location : EUROPE (Western and Northern)
Price : On request
More detailsLike new condition Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsReflected light microscope configured for brightfield and darkfield inspection stage has 6x6 xy travel 5 pla Location : EUROPE (Western and Northern)
Price : On request
More detailsConfigured for Top Alignment Wafer Size: Small Pieces up to 4"/100mm Diameter Wafers Exposure Modes: Hard, So Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsUsed, looks complete, very clean Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsUsed, looks complete, very clean Location : EUROPE (Western and Northern)
Price : On request
More details200mm Description Non working/running rvsi inspection set up for 267mm TSV. Missing robot, ocr cameras Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsSold in good working condition Refurbished WaferMark Sigmaclean Laser Marking Machine Vintage:2001 With Ultra Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab wh Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.