Used Metrology and inspection equipment
1,182 resultsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsAligner/Mask Year(s) : 2005, 2007 Location : ASIA (North East)
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More detailsX-Ray Inspection System consisting of: - PC & Monitors - Mouse and Keyboard Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More details(HIGH PRESSURE SCRUBBING) UP TO 8″ DIAMETER WAFERS INFRARED DRYER Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer-Edge Inspection Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsParticle Counter WAFER SIZE 12 Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsWafer Loader 150mm Complete Sold As Is Location : EUROPE (Western and Northern)
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More detailsInspection:visual inspection machine Year(s) : 2009 Location : ASIA (North East)
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More details【specification】 Observation method Epi-illumination: bright field, dark field, differential interference Sta Location : ASIA (North East)
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More detailsMeasurement target Seebeck coefficient Thermal conductivity (evaluate thermal conductivity by comparison with Year(s) : 2017 Location : ASIA (North East)
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More detailsVintage : JUN 2013 3D Solder Paste Inspection 220V 1 Phase Specifications The KY8030-2 has maintained the in Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Year(s) : 2001 Location : ASIA (North East)
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More detailsMicroscope Location : ASIA (North East)
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More detailsModel: Measurescope 20 Equipped with Nikon VS1-100A Position Scale Location : AMERICA North (USA-Canada-Mexico)
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More detailsUltra Microtome 【specification】 ・Section thickness setting range: 1nm to 15000nm ・Total sample feeding amoun Location : ASIA (North East)
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More details【specification】 ・Controller: IM-6700 ・Measuring head: IM-6125 ・Photograph element: 6.6 million pixels monochro Location : ASIA (North East)
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More detailsImage dimension measuring instrument 【specification】 ・Controller: IM-6600 ・Measuring head: IM-6140 (high prec Location : ASIA (North East)
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More detailsMicroscope Type Stereo Zoom Vacuum Chuck Diameter 6.0000 in (152.40 mm) Accessories Nikon SMZ-1 with Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 150 mm Microscope Type Microzoom Multiple Objectives Models Industrial 2.25X Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Model BH2-MJLT Year(s) : 1986 Location : ASIA (North East)
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More detailsManufacturer Ryoka System Model micromap r5500-m150 Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsScanning Electron Microscope (SEM) Model S 4500 Location : EUROPE (Western and Northern)
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More detailsVoltage: 110 VAC Operating system: Windows Pro SP3 2009 Vintage Complete and in working condition Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.