Used Metrology and inspection equipment
1,680 resultsInverted Fluorescence Motorised Microscope Model Observer.Z1 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus Location : EUROPE (Western and Northern)
Price : On request
More detailsSignatone CM100 manual prober Analytical probe station with submicron resolution Manual control of wafer stage Location : EUROPE (Western and Northern)
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More detailsOnly 100 working Hours, Open to best offers Year(s) : 2019 Location : EUROPE (Western and Northern)
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More detailsVintage: 2016 Brightness controller of 2D measurement need to be exchanged Please inspect tool to reconfirm Year(s) : 2016 Location : EUROPE (Western and Northern)
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More detailsVintage: 1995 Condition: good Wentworth Probe Station with probes, 105mm vacuum plate, 4 objectives, color di Year(s) : 1995 Location : EUROPE (Western and Northern)
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More detailsWafer size: 300mm Category: diffusion Process: ALO Furnace Pics 1-8 = tool 1 Pics 9-16 = tool 2 Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsTester Year(s) : 1993 Location : EUROPE (Western and Northern)
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More detailsREFURBISHED COMPLETE & WORKING CONDITION Binocular 3 Stage MHS 10×6 (X:250 Y:150) Processor DP-303 (X/Y/Z 3 ax Location : EUROPE (Western and Northern)
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More detailsWAFER SIZE 12 Year(s) : 2014 Location : EUROPE (Western and Northern)
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More detailsMissing some parts Sold as-is Wafer Size 200mm Location : EUROPE (Western and Northern)
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More details6" Condition: Good- Functional Location : EUROPE (Western and Northern)
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More detailsKLA-TENCOR Opti-2600 Thickness Measurement Year(s) : 1995 Location : EUROPE (Western and Northern)
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More detailsThis is being sold refurbished with a 3 months parts warranty. Its currently configured with SMIF but can be Year(s) : 1999 Location : EUROPE (Western and Northern)
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More detailsScanning Electron Microscope Model S 4500 SEM Year(s) : 1994 Location : EUROPE (Western and Northern)
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More details- 1 Phase - 50/60 Hz 2011 Vintage Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System Model Optistation 3100 Location : EUROPE (Western and Northern)
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More detailsRUDOLPH WV320 Wafer size: 300mm Process: measurement Location : EUROPE (Western and Northern)
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More detailsNikon NWL860 Wafer Loader With ISS200 Microscope Download the documents below for more information: NWL860 cat Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsProcess: UNDOPED-POLY INSPECTION DATE 2024-08-21 General Info 1 System Layout Main , Utility 2 System Type L- Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsTool ID T-103 Process COATER, DEVELOPER Wafer Size 200mm Year(s) : 1996 Location : EUROPE (Western and Northern)
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More detailsProcess:D-POLY INSPECTION DATE 2024. 08. 21 Gas system: 1 Process Gas N2, SiH4, Ph3, ClF3 2 Basic Style Integ Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsProcess Type: Microscope Location : EUROPE (Western and Northern)
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More details- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Alrea Location : EUROPE (Western and Northern)
Price : On request
More detailsOlympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPlan 20x/0.40, Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
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HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.