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Used Metrology and inspection equipment

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1

AOI 3D S3088 ultra chrome Vintage: 2019 Working hours: 17 000 3D sensor technology: * Z-resolution: 0.5 micro Year(s) : 2019 Location : EUROPE (Western and Northern)

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X-ray Inspection System Standalone Closed Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)

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- Light-tight enclosure designed for wafer probers - Cable ports on both sides of the box - Easy-lift Location : AMERICA North (USA-Canada-Mexico)

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Wafers 8" FIB Location : AMERICA North (USA-Canada-Mexico)

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- Condition: As-Is / Where-Is - Included Components: - PC Tower - Monitor Location : AMERICA North (USA-Canada-Mexico)

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- Wafer Size Range: 3" to 8" (up to 200 mm) - Control System: Labmaster integrated probing environment softw Location : AMERICA North (USA-Canada-Mexico)

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F30 Inspectiontool Power Requirements 200-240 V 10.0 A 50/60 Hz CE Marked YES Condition Fair Year(s) : 2011 Location : EUROPE (Western and Northern)

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- Condition Note: Excellent condition, fully reconditioned to factory specifications - Return Policy: 30-day Location : AMERICA North (USA-Canada-Mexico)

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Microscope : - Model :OLYMPUS MX50A-F - Objectives :5X,10X,20X,50X,150X Motorize objectives 2. Autoloader Location : ASIA (North East)

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Brand AITCO Vintage: Approximately 2019 Up to 8" capable Used Minimally for R&D & Light Production Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Approximately 20 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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AOI for panel or reel to reel, max panel size 515mmx515mm, max exposure area reel to reel 250mmx500mm. with Year(s) : 2016 Location : EUROPE (Western and Northern)

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KLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Can be configured to Location : AMERICA North (USA-Canada-Mexico)

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- True 3D AOI machine - Voltage: 200–240V - Quad-directional side cameras - Top light illumination - E Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

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- Machine is in fully functional condition. Location : AMERICA North (USA-Canada-Mexico)

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YTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Fully functional Location : EUROPE (Western and Northern)

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I Spector Marantz in like new condition. Complete with PC, and dongle. Software version 6.7.1 Year(s) : 2019 Location : EUROPE (Western and Northern)

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SEMITOOL 1-CHAMBER 300MM SPRAY ACID TOOL (SAT) consisting of: - Model: SAT-1100S1PSHU - Spray Acid Tool (SAT) Location : AMERICA North (USA-Canada-Mexico)

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- Up to 8"/200mm wafer handling - Allows small batch processing for R&D and Pilot Production - Load-locked Sys Location : AMERICA North (USA-Canada-Mexico)

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- Single chamber with load lock - Currently configured for 4" wafers - Can process up to 8"/200mm wafers (wit Location : AMERICA North (USA-Canada-Mexico)

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- Configured for 200mm Wafers - Single Cassette Station - Minimum Scan Step: 0.02mm - Maximum Points Per Scan: Location : AMERICA North (USA-Canada-Mexico)

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- Automated Surface Profilometer - Wafer Size: 8"/200mm - Automated Wafer Handler - 1 Open Loader for 200mm - Location : AMERICA North (USA-Canada-Mexico)

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- Spray Acid Tool (SAT) - Single Chamber - Up to 6"/150mm capable - Capacity: Single 25-Wafer Cassette, 150mm Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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