Used Metrology and inspection equipment
1,680 resultsDetails - Anly H8DA Counter/Timer - Omron H7ET Lamp Operator Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDual 300mm FIMS Standard and Oblique scanning mode, 0.060um sensitivity, 30mw Argon laser Location : AMERICA North (USA-Canada-Mexico)
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More details300mm Advanced Thin Films measurement tool Dual 300 mm load ports, WLR, BBSE, SWE, iDesorber, Stress Location : AMERICA North (USA-Canada-Mexico)
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More detailsThin Film Stress Measurement System, 150 mm and 200 mm wafer Location : AMERICA North (USA-Canada-Mexico)
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More detailsFRONT SIDE ALIGNMENT HIGH RESOLUTION ALIGNMENT FOR UP TO 4″ WAFERS SUSS POWER SUPPLY Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More details12.25×12.25 SQUARE BEAM (EXPOSURE HEAD IS MOTORIZED) 500 WATT LAMP, SPLIT FIELD VIDEO OPTICS WITH FLAT SCREEN Location : AMERICA North (USA-Canada-Mexico)
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More detailsSi wafers, 200/300mm wafers, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classification Location : AMERICA North (USA-Canada-Mexico)
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More detailsSi, Gan & Gas, Saphire 150/200mm, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classificat Location : AMERICA North (USA-Canada-Mexico)
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More detailsDual 300mm FIMS – DBS, SE, Stress, 200/300 mm chuck, Win NT, Summit 3.3, upgradable Location : AMERICA North (USA-Canada-Mexico)
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More detailsThin Film measurement tool Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetrology Location : AMERICA North (USA-Canada-Mexico)
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More detailsDark field defect detection tool, setup for 200mm or 300mm wafers, 2 Cameras 200 and 300mm compatible with dua Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Defect Inspection, for 150 or 200mm wafers, .25, 0.39, 0.62 um inspection spot size Location : AMERICA North (USA-Canada-Mexico)
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More details- Up to 8"/200mm wafer capable - Computer controlled - Measures roughness, waviness, step height, and other su Location : AMERICA North (USA-Canada-Mexico)
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More detailsUltratech Titan 4700 Stepper consisting of: - Model: Titan 4700 Stepper (Enclosure marked as 6700) - G & H Location : AMERICA North (USA-Canada-Mexico)
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More details- G & H Line Optics - Equipped for 4", 5", 6", and 8" wafers - 1000W Lamp - Extended Focus option for thick re Location : AMERICA North (USA-Canada-Mexico)
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More detailsFully Automatic 300mm wafer prober, Dual FIMS loadport, Cold (-25c, ambiant and hot) Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated High Resolution Stylus Profiler, for 150 and 200 mm Wafer Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI - Up to 300mm Wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-TENCOR 5200XP OVERLAY REGISTRATION SYSTEM consisting of: - Model: 5200XP - Overlay Registration(stepper al Location : AMERICA North (USA-Canada-Mexico)
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More detailsTop Down Viewing Camera 120VAC 1500W Max Specifications ( See Details above for installed options ) YESTech’s Location : AMERICA North (USA-Canada-Mexico)
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More detailsINLINE AOI SYSTEM MODEL VT S500-02 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsShadow Proof 3D Sensor 1D/2D Internal Reader Sigmalink Offline Review Software Vision 3D Program Inspection So Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsContact Profilometer Version: 150 mm Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOperational Status: Installed / Running Wafer Sizes: 4"/100mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.