Used Metrology and inspection equipment
1,680 resultsNikon Eclipse L200N Microscope consisting of: - Model: Eclipse L200N - L200N Stand with built in Transformer ( Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsX-Ray Inspection System consisting of: - PC & Monitors - Mouse and Keyboard Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- NSX Automated Wafer Handling System - Xandex 350-0002 Pneumatic Die Marker Controller - Objectives: 1, 2, 5, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Cybor Model 512 Power Supply - Cybor Control Module - Thermo Scientific A25 Chiller - SN: 0307 - Develope Location : AMERICA North (USA-Canada-Mexico)
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More detailsMania Argos 850 YOM 05/2003 Fully functional Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsSEM / FIB Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR CANDELA CS920 SURFACE ANALYZER consisting of: Model: Candela CS920 Vintage: 2017 Surface Analyzing Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR 2139 SURFACE INSPECTION SYSTEM consisting of: - Model: 2139 - Configured for 200mm Dual Open Ca Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR HRP-240 PROFILER consisting of: - Model: HRP-240 - Automated Surface Profiler - WAFER SIZE : 150mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsQA-MDI-02 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEO Technics CSM2000 Chip Scale Marker consisting of: - Manufacturer: EO Technics - Model: CSM2000 - Vintage: Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More details- ORC UV-MIOA UV Intensity Meter - SN: 19S000005 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More details- PC w/ windows XP - Maximum Throughput: 1 minute per wafer - Measurement Range: 2 mΩ/- 5 MΩ/ - Minimum Edge E Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAtomic Force Microscope (AFM) Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Power Requir Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsMicroscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More details[Specifications] - Model year: 2012 - Measurement principle: VSI method: White light vertical scanning interfe Year(s) : 2012 Location : ASIA (North East)
Price : On request
More detailsAOI System Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More details*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)
Price : On request
More detailsThe IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s). Power Requirem Year(s) : 1998 Location : EUROPE (Western and Northern)
Price : On request
More detailsManual wafer load profilometer Max wafer size: 8"/200mm Computer controlled Measures roughness, waviness, step Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin film measurement tool Broadband UV optics Dual beam spectrophotometry Wafer sizes: 100mm, 150mm, and 200m Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- 3 open cassette load stations - 5 anneal chambers - 3 Electrofill Cells (Plating Cells) - 3 Post Electrofill Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsEVG 620 MASK ALIGNER consisting of: - Model: EVG620 (Upgraded from a 420) - Manual Mask Aligner - Topside Ali Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haz Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.