Used Metrology and inspection equipment
1,680 results2D/3D Enabled – with OmniVision Digital Multi-Frequency Quad Moire 3D 15MP/ 10um Top Down Camera with Precis Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMirtec AOI Automatic Optical Inspection Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAsymtek Coating Table: Conformal Coating System Location : AMERICA North (USA-Canada-Mexico)
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More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage: 11/2012 Details: (1) 5MP Top Down Camera (4) 5MP Side View Cameras Windows XP Operating System Mirt Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details• Particle Size Range: 0.5 to 10 microns • Manifold: AM-12-1.0 aerosol manifold • Pump: AM-12 pump included • Location : AMERICA North (USA-Canada-Mexico)
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More details• Type: Secondary workstation for implanter • Version: Spares • Condition: As is where is • Lead time: Immedia Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTESCAN VEGA-II Model LSH SEM. Computer Controlled Scanning Electron Microscope, high vacuum operation, 230mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : APR 2010 120/208V 3 Phase 15" Max Board Width Specifications ( See Details above for installed opti Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More details• Resolution: 3 nm at 30 kV • Magnification: Up to 300,000× • Stage: 5-axis motorized • Sample Size: Supports Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsInsertion Machine Model MultiSert Location : AMERICA North (USA-Canada-Mexico)
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More details• AOI microscope • Load Ports: 2 units of Brooks load port • Version: 300 mm • Sales Condition: As is where is Location : AMERICA North (USA-Canada-Mexico)
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More details• Type: Field Emission SEM with EDX • Version: Laboratory • Sales Condition: As is where is • Lead Time: Immed Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray System Model YTX-3000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsGE Phoenix Nanomex PCBA Analyser 160 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsUltra SPI Solder Paste Inspection Machine Upgraded with Windows 7 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More details4-in-1 AOI Solution for Advanced PCB production Includes SLP, mSAP, advanced HDI, advanced Flex and IC substra Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsILX 1000 Inline X-Ray System Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVT-RNS II Inline AOI Machine Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-ray Inspection System Model FXS 100.24 Microfocus Location : AMERICA North (USA-Canada-Mexico)
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More detailsMake: Creative Electron TruView™ Novus The TruView™ Novus is a 2D, 2.5D, and 3D offline X-ray inspection syste Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : Rudolph Model : EL III Date Manufactured : 09/89 Ellipsometer </b> Details: Wafer Size Year(s) : 1989 Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : SemiTool Model : WST406MG Manufacture YR. : Dec. 2000 Desc : Solvent Processor </b> De Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpec : -Semitool graphic controller display screens -chemical cabinet (2 tanks, 1 for redian PRS1000, 1 for f Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.