Used Metrology and inspection equipment
1,182 resultsFILM FRAME MOUNTER, UP TO 8″ (200mm) WAFERS Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details7900-L, s/n: Z3D-7900-0412-0028, 300 mm Tool ID: ICD2900 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDescription: Delta 80+ photoresist coater Gyrset closed cover coating technology Wafer size up to 200mm 2 Waf Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails: Mechanical Pusher Pushes PCB’s from Magazine onto Conveyor of Next Machine Bottom Magazine Cl Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailseScan 500, sn: ML07114, Defect Review, 300mm Tool ID: SEI2703 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMA25 is for 4” ,double side aligner. Good working condition Location : ASIA (North East)
Price : On request
More detailsMicroscope Type Upright Microscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected L Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope inspection station Version: 200 mm Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details300mm, S/N PN00453 Tool ID: PROMOS_1158/082 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details12 inch WAFER PROBE SYSTEM Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details2001X 8 inch WAFER PROBE SYSTEM The item is only for end users. It is subject to prior sales without notice. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMeas: PL Mapper/2-4in Year(s) : 2010 Location : ASIA (North East)
Price : On request
More detailsoth: Wire pull Tester Location : ASIA (North East)
Price : On request
More detailsAOI suitable for inner- and outer layers, still in production on shopfloor Year(s) : 2005 Location : EUROPE (Western and Northern)
Price : On request
More detailsXD7500VR 160 KVa Open Tube X-ray System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- 2D AOI - Camera: 8 M Pixels - Resolution: 4,75 micro mètre - PCB dimensions: 50 mm x 50 mm up to 355 mm x 35 Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsSystem is still running at the fab and will be de installed soon Location : ASIA (North East)
Price : On request
More details- Dual Chamber - 8" Capable - SN: G83510 - Max Wafer: 200mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details500 WATT LAMP 9X9” COLLIMATING LENS CHOOSE UP TO 8”X8” CHUCK AND UP TO 9X9” MASK HOLDER Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspector Year(s) : 2014 Location : ASIA (North East)
Price : On request
More detailsInspection device Year(s) : 2015 Location : ASIA (North East)
Price : On request
More detailsInspection:X-RAY Year(s) : 2018 Location : ASIA (North East)
Price : On request
More detailsINS:Optical Equipment Location : ASIA (North East)
Price : On request
More detailsELE:integrating sphere Year(s) : 2014 Location : ASIA (North East)
Price : On request
More detailsTM-330 Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.