Used Metrology and inspection equipment
1,680 resultsMirtec MV-6E AOI System Max board: 18" x 16" 2D Inspection System 10 Mega Pixel Side-View Cameras 15 Mega Pixe Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Measurement method: Tunable diode laser absorption spectroscopy • Application: Permeation measurement • Suit Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More details• Application: Professional micromachining • Intended use: Research and development • Laser type compatibility Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More details• Observation method: Brightfield • Observation method: Darkfield • Observation method: Differential interfere Location : ASIA (North East)
Price : On request
More details• Observation method: Relief contrast (Hoffman phase contrast) • Total magnification: 40x • Total magnificatio Location : ASIA (North East)
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More details• Column bath temperature range: Room temperature +10°C to 400°C (−50°C to 400°C with liquefied CO₂) • Cooling Location : ASIA (North East)
Price : On request
More details(HIGH PRESSURE SCRUBBING) UP TO 8″ DIAMETER WAFERS INCLUDES CHUCK FOR 150x150mm INFRARED DRYER, HIGH SPEED S Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsatmospheric wafer robot for KLA Version: 300 mm Location : AMERICA North (USA-Canada-Mexico)
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More details• Type: Mask aligner • Power Supply: 1000 W • Resolution: 1 micron on 6″ wafers • Microscope: Split-field type Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Minimum Inspection Component Size: 01005" (0.4 × 0.2 mm) (10 µm resolution) • Positioning Accuracy: Pixel-re Location : EUROPE (Western and Northern)
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More detailsMirtec MV3 2D Desktop AOI System Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsViTech 5K 3D Inline AOI Machine Location : AMERICA North (USA-Canada-Mexico)
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More detailsMirtec MV3 3D Stand Alone AOI System Location : AMERICA North (USA-Canada-Mexico)
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More detailsMask aligner up to 6inch wafer Year(s) : 2009 Location : ASIA (North East)
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More detailsWafer Size 8" Tool's Condition Excellent Capable 4" to 8" Wafer Optical Console - Michelson Interferometer - Year(s) : 1994 Location : ASIA (North East)
Price : On request
More details・Pump: Serial dual piston Flow rate range: 0.001 to 10.0 mL/ min - Pressure range: 0 to 41 MPa (0 to 6000 psi Location : ASIA (North East)
Price : On request
More details• Optical magnification: 0.5x to 7.5x (9.33×7 to 0.622×0.467mm) • Stroke: X axis 300mm × Y axis 200mm × Z axis Location : ASIA (North East)
Price : On request
More details• Observation method: Transmitted light, fluorescent light • Total magnification: 40x, 100x, 200x, 400x, 1000x Location : ASIA (North East)
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More detailsVintage : OCT 2013 14" x 14" Work Area 208V 1 Phase 50/60Hz Specifications ( See Details above for installed Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
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More details• Software: UV WINLAB V6.4 • Detector: 2D Detector Module • Optical design: True double-beam, double-monochrom Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Spectral range: 175–3300 nm • Detector: Gridless PMT with Peltier-controlled PbS • UV/Vis resolution: 0.05 n Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Includes: Camera and monitor • Magnification range: 7X to 115X • Nosepiece: Revolving type, supports two obj Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetrology Equipment Year(s) : 2014 Location : EUROPE (Western and Northern)
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More detailsPower: 220VAC, 1ph, 50/60 Hz 8 Way 3D Camera / Projection System Max Board Size: approx. 850 × 690 mm Automati Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.