Used Metrology and inspection equipment
1,182 resultsAutomatic MASK(2/3/4/6in) Year(s) : 2014 Location : ASIA (North East)
Price : On request
More detailsStepper/6in Location : ASIA (North East)
Price : On request
More detailsModel type: Type2/103 (tip tip nominal diameter φ30μm) Measurement range: UMAP 185 x Y200 x Z175mm Image probe Location : ASIA (North East)
Price : On request
More detailsMonitor Color LCD TFT 15 type 3D display function Hybrid DFD method Image capturing element (CCD) 2.11 million Location : ASIA (North East)
Price : On request
More details3D multisensor dimensional Year(s) : 2007 Location : ASIA (North East)
Price : On request
More detailsWafer Testing and Metrology Location : ASIA (North East)
Price : On request
More details150mm Through the wall installation Independent He Cooling Phase III Robot Phase III Cassette Handler Bolt Dow Location : ASIA (North East)
Price : On request
More detailsStep Height Measurement Range Maximum 1310 kÅ Minimum 100 Å Step Height Resolution 1.00 Å Stylus Radi Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details150S Nomarski 1000X Microscope. Microscope has Nomarski optics on all objectives except for the 5X. Objectives Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 8" Vintage - . Scans samples up to 8 inch . Little or no sample preparation for increased produc Location : ASIA (North East)
Price : On request
More detailsDetails: Benchtop AOI Thunderbolt Interface Magma T1B CSCL (Center Light) CSRL (Repair Light) CSA (Analyser) O Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsStandalone Open Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7,000 X system magnificatio Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsRS 75 table type is still available, the condition is new/unused and in working condition Location : ASIA (North East)
Price : On request
More detailsCle: Wet Station/8in Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsexpress system Equipment name, model and quantity 1. Equipment Name: Resistance Tester 2. Equipment model: KL Location : ASIA (North East)
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More detailsMicroscope Digital Camera 【Main Specifications】 〇Control unit (DIGITAL SIGHT DS-L2) ・Brightness: 350cd/㎡ ・Sto Location : ASIA (North East)
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More detailsVT-S730 series Post Reflow inspection machines have been widely adopted in production lines where the highest Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsSystem Measurement Performance Spreading Resistance Dynamic Range : 1Ω to > 10Ω Reistivity : 10-⁴~ 4x10⁴Ωcm Co Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsMicroscope On Square Base Boom Stand Location : AMERICA North (USA-Canada-Mexico)
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More detailsZoom Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsIts a standard EVO – 1 system only – no ID system Standard wafer table 6 to 12 inch Ejector With 5 pos carouse Year(s) : 2011 Location : ASIA (North East)
Price : On request
More detailsZoom Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFilm thickness measurement Version: 200 mm Vintage: 01.06.2008 De-installed, warehoused. Can be inspected by Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsScanning Electron Microscope Model Merlin Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.