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Used Metrology and inspection equipment

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1

4″ FASPROBER (JOYSTICK MOVEMENT) INCLUDES STEREO ZOOM OPTICS WITH MICROSCOPE MOVEMENT Location : AMERICA North (USA-Canada-Mexico)

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Measuring instrument/Metal film thickness Year(s) : 2003 Location : ASIA (North East)

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Stepper/8in Year(s) : 1994 Location : ASIA (North East)

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Vintage : DEC 2015 Details 3D Solder Paste Inspection 220V 1 Phase 50/60Hz Specifications Koh Young Technol Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Width 47.244 in (120.0 cm) Depth 47.244 in (120.0 cm) Height 68.898 in (175.0 cm) Weight 1,323 Year(s) : 2004 Location : EUROPE (Western and Northern)

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Exterior Dimensions Width 118.110 in (300.0 cm) Depth 82.677 in (210.0 cm) Height 82.677 in ( Year(s) : 2010 Location : EUROPE (Western and Northern)

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Automated Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne Location : AMERICA North (USA-Canada-Mexico)

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Brand Omniphysics ○Main specifications ・Stage movement: X200mm, Y200mm ・Substage movement amount: X13mm, Y13m Location : ASIA (North East)

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Micromanipulator System [Configuration/Specifications] ・Manipulator (left and right arms): Operating ran Location : ASIA (North East)

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MOTORIZED OBJECTIVE TURRET 10, 20, 50X PLAN OBJECTIVES BRIGHT/DARK FIELD 100 WATT ILLUMINATION SOURCE 6X6″ TRA Location : AMERICA North (USA-Canada-Mexico)

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DOUBLE SIDED MASK ALIGNER DUAL 7” DIAMETER LIGHT SOURCES, 200 WATTS XY THETA MOVEMENT OF BOTTOM MASK AND SUBST Location : AMERICA North (USA-Canada-Mexico)

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MASK ALIGNER (HYBRID TECHNOLOGY GROUP) 7” DIAMETER BEAM. NEW TOUCH SCREEN CONTROLS REBUILT WITH 1 YEAR WARRANT Location : AMERICA North (USA-Canada-Mexico)

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Manual wafer load profilometer Max wafer size: 8"/200mm Computer controlled Measures roughness, waviness, step Location : AMERICA North (USA-Canada-Mexico)

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Expose up to 4” wafers 350 lamp with digital power supply. Upgraded with new PLC/HMI Touch screen controls. Hi Location : AMERICA North (USA-Canada-Mexico)

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FILM AND HYBRID APPLICATIONS. WAFERS UP TO 4.5″X5″ AREA. Location : AMERICA North (USA-Canada-Mexico)

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1000 WATT POWER SUPPLY 1 MICRON RESOLUTION ON 6″ WAFERS IR BACK SIDE ILLUMINATION SPLIT FIELD MICROSCOPE WITH Location : AMERICA North (USA-Canada-Mexico)

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Condition Very Good Model MPC 200XCu Wafer Size Range Minimum 150 mm Maximum 200 mm Year(s) : 2006 Location : EUROPE (Western and Northern)

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- Automated Surface Profilometer - Wafer Size: 8"/200mm - Automated Wafer Handler - 1 Open Loader for 200mm - Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 5 Location : ASIA (North East)

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Wafer Size 6 Year(s) : 1999 Location : ASIA (North East)

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Wafer Size 8 Year(s) : 1998 Location : ASIA (North East)

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Wafer Size 8 Year(s) : 1995 Location : ASIA (North East)

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4-in-1 AOI Solution for Advanced PCB production Includes SLP, mSAP, advanced HDI, advanced Flex and IC substra Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

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with Cymer XLA165 Track Pre-warning signal (APR)s: APR enabled Avoid Track INPUT/OUTPUT conflicts, Raise AS af Location : EUROPE (Western and Northern)

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Aligner/4in Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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