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Used Semiconductor Equipment

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1

Brand: Fusion Model: 200 PCU PHOTOSTABILIZATION SYSTEM Specifications • Used • Three axis robotic pick and pl Location : AMERICA North (USA-Canada-Mexico)

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Brand: Superior Electronics Model: AFPP-500 FULLY AUTOMATIC 4 POINT PROBE Specifications • Used • Fully Autom Location : AMERICA North (USA-Canada-Mexico)

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Brand: KLA-Tencor Model: Surfscan SP1-DLS WAFER SURFACE ANALYSIS SYSTEM Specifications • Used • 0.050um Defec Location : AMERICA North (USA-Canada-Mexico)

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Brand: KLA-Tencor Model: Alpha Step 500 PROFILOMETER Specifications • Used • Computer controlled Scanning and Location : AMERICA North (USA-Canada-Mexico)

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Brand: ADE Model: UltraGage 9500 MEASUREMENT SYSTEM Specifications • Used • Thickness - centerpoint, five poi Location : AMERICA North (USA-Canada-Mexico)

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Brand: Rudolph Research Model: FE-III FOCUS ELLIPSOMETER Specifications • Used • Class 1 filtered wafer envir Location : AMERICA North (USA-Canada-Mexico)

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Brand: KLA-Tencor Model: Surfscan 6400 FILM SURFACE ANALYSIS SYSTEM Specifications • Used • Measures surface Location : AMERICA North (USA-Canada-Mexico)

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Brand: GaSonics Model: 7104 PLASMA ETCH SYSTEM Specifications • Used • Front and backside isotropic removal • Location : AMERICA North (USA-Canada-Mexico)

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Features: Non-contact Low cost All-electronic gaging Fast set-up Easy operation Thickn Location : AMERICA North (USA-Canada-Mexico)

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Specifications: • Bench top programmable accurate thickness and thickness variation (TTV) measurement system Location : AMERICA North (USA-Canada-Mexico)

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Description: Auto Mapping System. Location : AMERICA North (USA-Canada-Mexico)

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Features: Non-contact Accurate Digital display Temperature compensation High or Low Resist Location : AMERICA North (USA-Canada-Mexico)

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Features: Non-contact Accurate Digital display Wide operating range ASTM standard Thic Location : AMERICA North (USA-Canada-Mexico)

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Description: 300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Location : AMERICA North (USA-Canada-Mexico)

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Specifications: Stylus:12.5 um radius (Diamond) Scan Range: x:50 um - 50mm; z: 100 A - 131 um z R Location : AMERICA North (USA-Canada-Mexico)

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Features: RF etch DC and RF deposition stations PE 2KW RF power supply AE MDX DC P/S Digit Location : AMERICA North (USA-Canada-Mexico)

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Features: 3 source system 2/Deposition and 1/RF DC bias Main processing system with load lock Capa Location : AMERICA North (USA-Canada-Mexico)

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Features: 10x objectives 1000-watt lamphouse UV 400 diffraction reducing optics 365nm/405nm in Location : AMERICA North (USA-Canada-Mexico)

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Specifications: For wafers from 2" to 6" or substrates from 3" x 3" up to 6"6" Fiber optics tube: 2 ar Location : AMERICA North (USA-Canada-Mexico)

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Specifications: UV broadband (250nm-450nm), I-line (365nm) and G-line (436nm) wavelength available. Contac Location : AMERICA North (USA-Canada-Mexico)

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Specifications: System capable of 3" to 5" Cassette to Cassette 350 W Lamp UV-400 Exposure op Location : AMERICA North (USA-Canada-Mexico)

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Features: Accommodates wafers up to 8" 2 channel brightfield microscope Three position turret nos Location : AMERICA North (USA-Canada-Mexico)

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Features: Capable of wafers up to 8"/200mm Capable of working with wafer masks up to 9" x 9" Autom Location : AMERICA North (USA-Canada-Mexico)

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Features: Chamber size 155mm/6" ID Uses 57mm diameter disc targets Carbon evaporation power suppl Location : AMERICA North (USA-Canada-Mexico)

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Specifications: 2"-3" Chuck and holder for 4 in. square mask 78 mm diameter of wafer exposure Pow Location : AMERICA North (USA-Canada-Mexico)

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You can find used Semiconductor Equipment on Wotol

For second hand Semiconductor Equipment we have Wafer Equipment, Wafer Handler & Robots, CVD Equipment, Wet Bench, Lithography & Photoresist, Plasma Etcher / Asher, Dicer & Scriber, Grinding, Lapping & Polishing, Component Counters/Tapers, Dry Pump, Bonder, Metrology and inspection equipment. The main manufacturers for used Semiconductor Equipment are KLA-Tencor, Plasmatherm, AMAT, TEL, Disco, Karl Suss, Canon, Semitool, Hitachi, Nanometrics, Nikon, Applied Materials, Tegal, Varian.

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