Used Metrology and inspection equipment
1,680 resultsCYBEROPTICS SE 300 ULTRA 3D Solder Paste Inspection - Inline inspection system after printer - Vintage 2008 Location : EUROPE (Central and Eastern)
Price : On request
More detailsCYBEROPTICS model SE 300 ULTRA online SPI inspection machine - 508mm x 508mm card size - thickness from 0.5mm Location : EUROPE (Central and Eastern)
Price : On request
More detailsFacilities: 208-240VAC 50/60Hz, 10A / Air: 60 PSI, 1 CFM Dims: 39" W x 43.3" D x 62" H @ 1100 lbs Transfer Dir Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFacilities: 110 VAC 1ph, 50/60Hz, 15amps / 80 psi, 2 CFM Dims: 59" x 66" x 63" @ 5,500 lbs offers complete ins Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette Location : AMERICA North (USA-Canada-Mexico)
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More detailsRework System Year(s) : 2018 Location : -
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More detailsAutomated Optical Inspection Year(s) : 2016 Location : -
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More detailsEllipsometer system, X-ray, with CFT75A2 chiller Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: ADE Model: UltraScan 9300 WAFER INSPECTION SYSTEM Specifications • Used • 2 cassette input stations • Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: 6200 ANALYSIS SYSTEM Specifications • Used • Instantaneous mangified 3-D views of in Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor P20H Long Scan Profiler</b> Long scan profiler measurement tool. Features: Ability to fit Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor 6220 Surfscan</b> This tool detects, counts, and sizes defects Specifications: Throughput: Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Superior Electronics Model: AFPP-500 FULLY AUTOMATIC 4 POINT PROBE Specifications • Used • Fully Autom Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: Surfscan SP1-DLS WAFER SURFACE ANALYSIS SYSTEM Specifications • Used • 0.050um Defec Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: Alpha Step 500 PROFILOMETER Specifications • Used • Computer controlled Scanning and Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: ADE Model: UltraGage 9500 MEASUREMENT SYSTEM Specifications • Used • Thickness - centerpoint, five poi Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Rudolph Research Model: FE-III FOCUS ELLIPSOMETER Specifications • Used • Class 1 filtered wafer envir Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA-Tencor Model: Surfscan 6400 FILM SURFACE ANALYSIS SYSTEM Specifications • Used • Measures surface Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: Non-contact Low cost All-electronic gaging Fast set-up Easy operation Thickn Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Auto Mapping System. Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: Non-contact Accurate Digital display Temperature compensation High or Low Resist Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: Non-contact Accurate Digital display Wide operating range ASTM standard Thic Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: 300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpecifications: Stylus:12.5 um radius (Diamond) Scan Range: x:50 um - 50mm; z: 100 A - 131 um z R Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpecifications: Load locked single wafer sputter, cassette to cassette vertically mounted for sideways spu Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.