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Used Metrology and inspection equipment

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Automated Optical Inspection Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Condition: Complete & Operational Availability: 05-31-21 Location : AMERICA North (USA-Canada-Mexico)

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24" x 18" x 8" Range New PC Controller NEW Stage Glass Programmable Ring Light Measure Mind 3D Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

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I-20 MI-SCOPE-120 Description Other: Ultrasonic scan analyzer Location : ASIA (North East)

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Details: Windows XP Operating System Software Rls: 1.49 Dual Table Fiducial Camera with Fiduci Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Condition: Complete & Operational Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Details: 5 Cameras Bar Code NG Marking 4.2.0 Software 2048 x 2048 Resolution Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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<b>1x MEK, PowerSpector S1, Inspection Equipment Description</b> The PowerSpector S1 5D SPI from MEK is a pow Location : EUROPE (Western and Northern)

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<b>1x MEK, SpectorBOX, Modular AOI Description</b> the MEK SpectorBOX you get simultaneous top-down and botto Location : EUROPE (Western and Northern)

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<b>1x MEK, Ispector, Desktop AOI Description</b> The MEK Desktop AOI comes as a PowerSpector and ISpector. Th Location : EUROPE (Western and Northern)

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Temptronics TP04390A THERMOSTREAM THERMAL INDUCING SYSTEM GRADE C; UNIT PASSED SELF DIAGNOSTICS. NO HDD. MISS Location : AMERICA North (USA-Canada-Mexico)

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* EQP-00564 & EQP-00565 * Automatic wafer inspection system * 3", 4" and 5" 6" capacity * Computer control Oly Location : AMERICA North (USA-Canada-Mexico)

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Viking VIS-100W Die Inspection Systems (VIS-100W Die Inspection System) * EQP-00564 & EQP-00565 * Automatic Location : AMERICA North (USA-Canada-Mexico)

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Tencor Sigmascan Profilometer & printer (Sigmascan model 80-00110) Tencor Sigmascan. Film thickness and Surf Location : AMERICA North (USA-Canada-Mexico)

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Tencor OmniMap NC-110 * Non-Contact Resistivity System. * Measures complex aluminum and tungsten multilayer Location : AMERICA North (USA-Canada-Mexico)

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QC Optics OPTIQUEST reticle inspection Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-530e Thin Film Mapping System. Location : AMERICA North (USA-Canada-Mexico)

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OPAL 7830i CD-SEM Location : AMERICA North (USA-Canada-Mexico)

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Wentworth 925 (925) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)

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TSK UF200 Automatic Prober * Single Cassette loader * Real time wafer map display and print * Heat up Chuck Location : AMERICA North (USA-Canada-Mexico)

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TSK APM90A Automatic Wafer Probers Single cassette loader -Head stage Standard -Real time wafer map display Location : AMERICA North (USA-Canada-Mexico)

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TSK AMP88 (AMP88) Wafer prober Location : AMERICA North (USA-Canada-Mexico)

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Teledyne TAC PR-100 Prober (TAC PR-100) Location : AMERICA North (USA-Canada-Mexico)

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TEL P8 Wafer prober. Bottom loader, Hot chuck. System is located in Santa Clara, CA abd available for inspect Location : AMERICA North (USA-Canada-Mexico)

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Dymatix 680E (680E) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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