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KLA-Tencor 6100 Surfscan Analysis System
Ref :
1477221-9-W
Condition :
Used
Manufacturer :
KLA-Tencor
Model :
6100 Surfscan Analysis System
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
24 Apr. 2020
1x, KLA-Tencor 6100 Surfscan Analysis System
Unpatterned wafer surface contamination analyzer
Features:
Instantaneous magnified 3-D views of individual defects.
Color coded defect maps, histograms, and other graphics.
Surface haze detection.
Specifications:
Submicron sensitivity detects 0.16 micron particles
Capable of handling 4, 5, and 6 inch wafers.
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