Used Metrology and inspection equipment
1,680 resultsWafer Size 8" Vintage 2012-3 Tool's Condition Refurbishing The KLA-Tencor P-16+ Profiler is a highly sensiti Year(s) : 2012 Location : ASIA (North East)
Price : On request
More detailsModel Dimension 7000 Wafer Size 8" Vintage 1996-3 Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Tool's Condition Refurbishing 1.Microscope : - Model : OLYMPUS MX61L F - Objectives :5X,10X,20 Location : ASIA (North East)
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More detailsModel Loc 8 YOM 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsWafer Size 8" Vintage 2018-4 Tool's Condition Refurbishing ■ System Configuration . WT2020 main unit with sc Year(s) : 2018 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2009-5 Tool's Condition Excellent ■ System Configuration . WT2000PV main unit with scan Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" . Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Me Year(s) : 0 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2000-10 . Wafer size : 200mm . CE marked . Single open cssette handler . Image Computer Year(s) : 2000 Location : ASIA (North East)
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More detailsMicroscope Location : ASIA (North East)
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More detailsWafer Size: 200mm 150/200mm Open Handler Software Version 5.3.17.4 Double Darkfield Inspection Tool SECS II Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLaser System Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More details- Dual Chamber - 8" Capable - SN: G83510 - Max Wafer: 200mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- CTI Cryogenics 9600 Compressor - Set Up for 6" Wafers - Computer - Keyboard & Mouse Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- 5x, 10x, 20x, 50x & 100x Objectives - Computer - Keyboard & Mouse Location : AMERICA North (USA-Canada-Mexico)
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More details- NSX Automated Wafer Handling System - Xandex 350-0002 Pneumatic Die Marker Controller - Objectives: 1, 2, 5, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- AutoLoader - Objectives: 2.5, 5, 10, 20, 50x - Hitachi KP-D20BU CCD Camera - Computer - Keyboard & Mouse - Location : AMERICA North (USA-Canada-Mexico)
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More details- Xandex 350-0002 Pneumatic Die Marker Controller - PC - Monitor - Keyboard and Mouse Location : AMERICA North (USA-Canada-Mexico)
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More details- Wafer sizes: 100mm, 150mm, and 200mm - Thin film measurement tool - Broadband UV optics - Dual beam spectrop Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Automatic Alignment - Up to 6"/150mm Wafer Capable (with pro Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Long Scan Surface Profilometer - Wafer Size: 8"/200mm - S/N: 1090-0420 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFully refurbished to like-new condition, including 1 year warranty, professional installation, and also proce Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x, KLA-Tencor, 2138XP Surface Inspection System</b> - Currently Setup for Processing 8"/200mm Wafers - L Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 8" Vintage - . Scans samples up to 8 inch . Little or no sample preparation for increased produc Location : ASIA (North East)
Price : On request
More detailsSystem Measurement Performance Spreading Resistance Dynamic Range : 1Ω to > 10Ω Reistivity : 10-⁴~ 4x10⁴Ωcm Co Year(s) : 2004 Location : ASIA (North East)
Price : On request
More details[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator I Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.