Used Metrology and inspection equipment
1,680 resultsModel WS3500/3800 upgrade RVSI VISUAL DEFECT SCANNER Year of Manufacture 2004 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsUpgrade Inspection scanner Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWindows 10 Operating System Board Carrier: 24″ x 16″ High Efficiency Preheater Board Cooling System Leica Ster Location : AMERICA North (USA-Canada-Mexico)
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More detailsVT-S730 series Post Reflow inspection machines have been widely adopted in production lines where the highest Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsMachine specifications are as follows: Camera technology Orthogonal camera module 8M-CBW (white LEDs) Field of Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsXiDAT6500 X-Ray in excellent condition Location : EUROPE (Western and Northern)
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More detailsEmbedded industrial PC With intelligent temperature module and stepper motor driver, Stable and reliable. Wind Location : EUROPE (Western and Northern)
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More detailsEmbedded industrial PC With intelligent temperature module, Stable and reliable. Windows Operating system in E Year(s) : 2016 Location : EUROPE (Western and Northern)
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More detailsCD-SEM/6in. Location : ASIA (North East)
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More detailsMicroscope Location : ASIA (North East)
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More detailsDetails Optiv Classic Benchtop CMM Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More details200mm Tool ID: HFCLN-01 Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Electron Microscope Model Merlin Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More details7900-L, s/n: Z3D-7900-0412-0028, 300 mm Tool ID: ICD2900 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailseScan 500, sn: ML07114, Defect Review, 300mm Tool ID: SEI2703 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More details300mm, S/N PN00453 Tool ID: PROMOS_1158/082 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsP12XLn prober Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrightfield inspection Location : AMERICA North (USA-Canada-Mexico)
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More details150mm Manual Analytical Wafer Prober. Vacuum Chuck: 6” dia. (150mm). Manual XY stage movement: 6” X x 6” Y. P Location : AMERICA North (USA-Canada-Mexico)
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More details150S Nomarski 1000X Microscope. Microscope has Nomarski optics on all objectives except for the 5X. Objectives Location : AMERICA North (USA-Canada-Mexico)
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More detailsManual Analytical Wafer Probe Station. Wafer prober designed to support a broad range of precision probing ap Location : AMERICA North (USA-Canada-Mexico)
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More detailsView Pinnacle 250 Video Measuring Tool. The Pinnacle features a damped granite base and column, with passive Location : AMERICA North (USA-Canada-Mexico)
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More detailsS-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytic Location : AMERICA North (USA-Canada-Mexico)
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More detailsWyko NT9800 Noncontact Profiler Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8" Tool's Condition Refurbishing Step height: Nanometers to 1000µ;m Step height repeatability : 4 Year(s) : 2017 Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.