Used Laboratory and Testing equipment

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Nanometrics 180 * Microspectrophotometer head can measure in Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline V CD Measure Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline IV CD Measure Measures line widths, gaps, holes and registration alignment. Range 0.5 to Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto gai Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CD 50 Measure (Nanometrics Nanoline CD 50) Nanometrics Nanoline CD 50 Line width Measur Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up to 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA 8020 AIT s/n 0800-824 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA - Tencor UV 1080 * Prometrix UV-1080 * Max wafer capable: 200mm * Intel Pentium III Computer * Windows Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L117 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L116 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L115 Ellipsometer Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak IID Profilometer * Measurement display range 200A to 655,000A. * Three scan speeds. * Scan length: 5 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak IIA Profilometer Measurement display range 200A to 655,000A. Three scan speeds. Scan length: 50 Micron Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak II Profilometer * EQP-00845-SI * Measurement range: 10A to 655,000A. * Vertical resolution: 10A. * Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: EFD EFD, Valvemate 7000 Controller Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: EFD EFD, 1500 XL Controller (1500 XL) Liquid / Epoxy Adhesive Dispenser Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor Auto OmniMap RS-100 Resistivity Mapping System Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor M-Gage 300 with Allwin21 computer upgrade * Non-Contact Wafer Monitor for Sheet resistance. * Can acco Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA/Tencor P-20H Long Scan Profiler * Long Scan Profiler Measurement of vertical features ranging from 100 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: DEKTAK DEKTAK Model 8000 Surface profile 200 mm sample stage, 1A resolution at 65 kA, Windows interfa Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Dektak Dektak 3ST Profilometer * Vertical range: 100A to 1,310KA. * Vertical resolution: 1A/65KA, 10A Location : AMERICA North (USA-Canada-Mexico)

Price : On request