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Used Laboratory and Testing equipment

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1

Details: 115V– 1 Phase – 60Hz Automatically removes and measuring contamination Automatic regenera Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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Self-contained system Simple, user-friendly operation featuring integrated computer and display Stair- Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Condition: Complete & Operational Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Elec: Power Meter Location : ASIA (North East)

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Elec: Spectrum Analyzer Location : ASIA (North East)

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Other: Bond Tester Year(s) : 1994 Location : ASIA (North East)

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Configuration: (16) Ultra 1 to 4 pin Cards – Part No. N90004-0385-00 ICA AFTM PC Controller Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Seica, Valid Line, Test Equipment Description</b> The Valid Line from Seica for functional testing incl Location : EUROPE (Western and Northern)

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<b>1x Seica, Rapid Line, flying probes Description</b> The Rapid Line from Seica offers models with horizonta Location : EUROPE (Western and Northern)

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<b>1x Seica, Pilot 4D Line, Flying Probe tester Description</b> Pilot 4D from Seica is the most versatile and Location : EUROPE (Western and Northern)

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<b>1x Seica, Mini Line, Test Equipment Description</b> The Mini Line from Seica is designed to fulfil the req Location : EUROPE (Western and Northern)

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* EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load the wafer and close the lid. * A Location : AMERICA North (USA-Canada-Mexico)

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This is the "Base and Handler" only for a Tencor P2. Location : AMERICA North (USA-Canada-Mexico)

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Manufacturer: Tencor Email Us Want to Service Want to Sell Related Products Mfg. Part#: Tencor P-2H Profil Location : AMERICA North (USA-Canada-Mexico)

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* Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical range: +/- 6.5um at 1A resolution & +/- Location : AMERICA North (USA-Canada-Mexico)

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System was originally set up for disks but can easily be converted for wafers. Three dimensional and selected Location : AMERICA North (USA-Canada-Mexico)

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Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Tencor software version 2. Location : AMERICA North (USA-Canada-Mexico)

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Three dimensional and selected two dimensional data display. Scan length 60 mm. Step height repeatability, 0.0 Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. Can accommodate up to 5". Measurement range: 1m ohm/square t Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

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Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 23 Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor Flexus 2908 Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-11 Profilometer Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-2 Long Scan Profilometer * Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical ran Location : AMERICA North (USA-Canada-Mexico)

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Veeco FPP-5000 Four Point Probe * EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load Location : AMERICA North (USA-Canada-Mexico)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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