Used Semiconductor Equipment

Oxide film thickness measurement (PC missing) Version: 200 mm Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanospec Wafer Metrology film thickness measurement tool Version: 200 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Photo-lithography 248 NM DUV Scanner with photo-track Version: 300 MM Vintage: 01.06.2002 The equipmewnt has Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Vintage: 01.05.1997 Cassette to Cassette Handling of 200mm Wafers Non-Contact Wafer Pre-Alignment Trinocular H Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Inspection Microscope •5 Position Turret with Motorized Rotation •CF Plan 2.5X Bright/Darkfield Object Location : AMERICA North (USA-Canada-Mexico)

Price : On request

CMP metrology system Version: 300 mm -De-installed, warehoused. Can be inspected by appointment. -Has CE mark Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Ellipsometer for CD and thin film measurements Version: 300 mm Vintage: 01.01.2018 Nova Instruments T600 Multi Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Inspection Microscope with autoloader Version: 100 MM AND 150 mm In good working condition Has CE safety Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dual Chamber R.I.E. Version: 200 mm Vintage: 01.06.1994 includes: -LH and RH chambers are RIE with adjustable Year(s) : 1994 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ultrasonic wedge bonder is a simple yet very efficient semi-automatic bonder Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Inspection Microscope Version: 150 mm Microscope Type Upright Microscope Configuration Brightfield Ill Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dual Chamber RIE / Plasma etch Version: 200 mm Vintage: 01.04.1999 The LH Chamber is Standard, the RH chamber Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer autoloader (Not including microscope) Version: 100MM TO 150 MM Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Sorter with 4 wafer loading ports Version: 300 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dual arm Atmospheric wafer handling robot Version: 200 mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Motorized top brander. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

AOI/SPI/PCB Inspection Conveyor Specifications PCB Size 50 mm x 50 mm to 450 mm x 350 mm wide (1.97" x 1.97" t Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Spatial Resolution 20 line-pairs/mm (standard) 100 line-pairs/mm (w/ optional 10 μm x-ray source) Ano Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Manncorp Manncorp Sherlock-300F Benchtop AOI Machine Maximum PCB Size 13" x 9.85" (330 mm x 250 mm) 2 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Manncorp Manncorp BC Series Inspection / Linking Conveyors PCB Size 50 mm L x 50 mm W to 530 mm L x 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Manncorp Manncorp Sherlock-300I Inline AOI Machine Minimum PCB Size 2" x 2" (50 mm to 50 mm) Maximum Location : AMERICA North (USA-Canada-Mexico)

Price : On request