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Used Semiconductor Equipment

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- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)

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Longdescription: with 6" vacuum Chuck Microscope Ocular: Bausch & Lomb 10 x W.F. Objective: 2,25 x 0,04,8 x 0 Location : EUROPE (Western and Northern)

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- Light-tight enclosure designed for wafer probers - Cable ports on both sides of the box - Easy-lift Location : AMERICA North (USA-Canada-Mexico)

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Wafers 8" FIB Location : AMERICA North (USA-Canada-Mexico)

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- Measurement Angles: 20°, 60°, and 85° (from high to low gloss) - Reflection Haze: Yes, for high gloss finish Location : AMERICA North (USA-Canada-Mexico)

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- Control: Electronic controls with touch screen display - Sample Holder: 6-position with precise down press Location : AMERICA North (USA-Canada-Mexico)

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- Blade Speed: 200 to 5000 rpm - Blade Diameter Capability: 3" to 8" wafer blades - Feed Mechanism: Linear Location : AMERICA North (USA-Canada-Mexico)

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- Condition: As-Is / Where-Is - Included Components: - PC Tower - Monitor Location : AMERICA North (USA-Canada-Mexico)

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Wafer Transfer Robot. Was used in a vacuum cluster tool. No cables or controllers. Location : AMERICA North (USA-Canada-Mexico)

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- Wafer Size Range: 3" to 8" (up to 200 mm) - Control System: Labmaster integrated probing environment softw Location : AMERICA North (USA-Canada-Mexico)

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F30 Inspectiontool Power Requirements 200-240 V 10.0 A 50/60 Hz CE Marked YES Condition Fair Year(s) : 2011 Location : EUROPE (Western and Northern)

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Width 70.866 in (180.0 cm) Depth 26.772 in (68.0 cm) Height 86.614 in (220.0 cm) Weight 22,046 Year(s) : 1996 Location : EUROPE (Western and Northern)

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- Wafer Size Range: 200 mm - Condition: Good - Manufacturing Date: 2004 - Width: 354.0 cm (139.37 in) Year(s) : 2004 Location : EUROPE (Western and Northern)

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- Condition Note: Excellent condition, fully reconditioned to factory specifications - Return Policy: 30-day Location : AMERICA North (USA-Canada-Mexico)

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Microscope : - Model :OLYMPUS MX50A-F - Objectives :5X,10X,20X,50X,150X Motorize objectives 2. Autoloader Location : ASIA (North East)

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Brand AITCO Vintage: Approximately 2019 Up to 8" capable Used Minimally for R&D & Light Production Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Approximately 20 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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APPLIED MATERIALS AMAT CENTURA II consisting of: - 2 DPS / DTM Chambers - Configured for 200mm - Vintage: 2019 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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AOI for panel or reel to reel, max panel size 515mmx515mm, max exposure area reel to reel 250mmx500mm. with Year(s) : 2016 Location : EUROPE (Western and Northern)

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KLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Can be configured to Location : AMERICA North (USA-Canada-Mexico)

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MOLD PRESS Year of Manufacture 2006 Condition Good Year(s) : 2006 Location : EUROPE (Western and Northern)

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FINMAC DEFLASH Year of Manufacture 1994 Condition Good Location : EUROPE (Western and Northern)

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Accessories Monitors Condition Good Year of Manufacture 2018 Year(s) : 2018 Location : EUROPE (Western and Northern)

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- True 3D AOI machine - Voltage: 200–240V - Quad-directional side cameras - Top light illumination - E Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

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- Machine is in fully functional condition. Location : AMERICA North (USA-Canada-Mexico)

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You can find used Semiconductor Equipment on Wotol

For second hand Semiconductor Equipment we have Wafer Equipment, Wafer Handler & Robots, CVD Equipment, Wet Bench, Lithography & Photoresist, Plasma Etcher / Asher, Dicer & Scriber, Grinding, Lapping & Polishing, Component Counters/Tapers, Dry Pump, Bonder, Metrology and inspection equipment. The main manufacturers for used Semiconductor Equipment are KLA-Tencor, Plasmatherm, AMAT, TEL, Disco, Karl Suss, Canon, Semitool, Hitachi, Nanometrics, Nikon, Applied Materials, Tegal, Varian.

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