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Used Metrology and inspection equipment

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Optima MD, 300mm, s/n: 083011 Medium Current Implant Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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The system is capable of inspection at resolutions ranging from 25 to 10 µm, utilizing TRI’ hallmark Dynamic I Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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This highly accurate inline shadow-free solder paste inspection system offers full 3D inspection at resolution Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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Capable of inspecting at speeds of up to 160 cm2/sec, the TR7007 offers ultra-fast solder paste inspection wit Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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160kV Max. Board Size: 508 x 444mm Max. Inspection Area: 458 x 407mm Windows OS TUBE – NT MK II 250 3W POWER S Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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8000-1L Axial Lead Prepper cut/prep .030″ to .055″ diameter leads good condition FAST SIMPLE RELIABLE Location : AMERICA North (USA-Canada-Mexico)

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AOI system Revised, ready to work. Available for immediate delivery. Contact us for details: contact@elmotek. Year(s) : 2011 Location : EUROPE (Western and Northern)

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AOI system Location : EUROPE (Western and Northern)

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Inline AOI Machine Complete with: Loader E-Cube (2008) Unloader E-Cube (2008) Year(s) : 2004 Location : EUROPE (Western and Northern)

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AOI System 2D INLINE Location : EUROPE (Western and Northern)

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Details: Dimensions 28" x 53 1/4" x 53" Weight 288 lbs Electrical Requirements (North America): 120VAC, 10 Am Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Voltage: 115 Single lane Operating System Windows 2000 Vision 2007 Ver 4.8 program Manual - soft copy on machi Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Binocular Viewing Head with 2ea CFI 10X Eyepieces Nikon Ti2-N-ND-E Motorized DIC Sextuple Nosepiece, Including Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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Zeiss Model D Tiltable Stand (G) Motorized Z-Drives for Focusing & Pivot Point Adjustment Tilting angle ≤ 45° Location : AMERICA North (USA-Canada-Mexico)

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Step Height Measurement Range Maximum 1310 kÅ Minimum 100 Å Step Height Resolution 1.00 Å Stylus Radi Location : AMERICA North (USA-Canada-Mexico)

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Microscope Type Upright Microscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected L Location : AMERICA North (USA-Canada-Mexico)

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Nanoscope III Scanning Probe Microscope Location : AMERICA North (USA-Canada-Mexico)

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Spin RInser/Dryer Location : AMERICA North (USA-Canada-Mexico)

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microscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiec Location : AMERICA North (USA-Canada-Mexico)

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Overlay Metrology System Location : AMERICA North (USA-Canada-Mexico)

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Ergolux Microscope Location : AMERICA North (USA-Canada-Mexico)

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UM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System co Location : AMERICA North (USA-Canada-Mexico)

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Stage module A(R) with 5 dovetail slide rails. Objective module with sextuple revolving nosepiece (LD-Plan Location : AMERICA North (USA-Canada-Mexico)

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ST Surface Profiler Location : AMERICA North (USA-Canada-Mexico)

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NanoSpec AFT 200 Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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