Used Metrology and inspection equipment
1,680 resultsIllumination Type Reflected Light Stage Type Coaxial X-Y Stage Area Length: 267 mm (10.512 in) Width: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size Range Minimum 50 mm Maximum 150 mm Set Size 150 mm Alignment Optics Splitfield Video So Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel Periplan GF Magnification 10 X Field Number 18 mm Focusing YES Motorized Nosepiece YES Multip Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 150 mm Illumination Source Type HeNe Laser Other Information Operating wavelen Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Type Controller Model C225 Ro Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer size: 8 inch with notch Chamber depth: 7.25" Posts with SS ball bearings Software ver 1.51 Require 24VDC Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Upright Microscope Configuration Brightfield Illumination Type Reflected Light Binocular An Location : AMERICA North (USA-Canada-Mexico)
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More detailsPatterned Wafer Contamination Analyzer Cassette to Cassette YES Condition Excellent Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : JUN 2013 3D Solder Paste Inspection 220V 1 Phase Specifications The KY8030-2 has maintained the in Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Location : ASIA (North East)
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More details- Suss E-Rack - Qty 2 Cybor Control Module - Julabo F-30CL Chiller - Julabo FC600S Chiller - Qty 2 Coater Wa Location : AMERICA North (USA-Canada-Mexico)
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More detailsManufacturer Ryoka System Model micromap r5500-m150 Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsVoltage: 110 VAC Operating system: Windows Pro SP3 2009 Vintage Complete and in working condition Year(s) : 2009 Location : EUROPE (Western and Northern)
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More detailsBruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables 4 angstrom repeatability. Unm Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configu Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Surface Defect/4-6in Year(s) : 2017 Location : ASIA (North East)
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More details160 kV 20 W Nanotech source, feature recognition 500 nm. 5 axis manipulator, max supported weight 5 kg. Max sa Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCD-SEM Location : ASIA (North East)
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More detailsSemi Auto Pad Shave Tool RSV Automation PDS01 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsworking condition Year(s) : 2015 Location : EUROPE (Western and Northern)
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More details300mm Nickel Plated Chuck With H325C Chiller for Tri-Temp Operation (to -25°C) Hinged Test Head Manipulator Location : AMERICA North (USA-Canada-Mexico)
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More detailsOLYMPUS MX50A-F Reflected Light Microscope Five Position Motorized Turret with the Following Objective Lenses Location : AMERICA North (USA-Canada-Mexico)
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More detailsJ.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Stress Gauge Model 900TC-VAC Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.