Used Laboratory and Testing equipment

Keysight-Agilent 86120C Features: Wavelength scan in less than 1sec Wavelength accuracy: +- 2 ppm for laser l Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto gai Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CD 50 Measure (Nanometrics Nanoline CD 50) Nanometrics Nanoline CD 50 Line width Measur Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up to 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA 8020 AIT s/n 0800-824 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA - Tencor UV 1080 * Prometrix UV-1080 * Max wafer capable: 200mm * Intel Pentium III Computer * Windows Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L117 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L116 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner L115 Ellipsometer Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak IID Profilometer * Measurement display range 200A to 655,000A. * Three scan speeds. * Scan length: 5 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak IIA Profilometer Measurement display range 200A to 655,000A. Three scan speeds. Scan length: 50 Micron Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dektak II Profilometer * EQP-00845-SI * Measurement range: 10A to 655,000A. * Vertical resolution: 10A. * Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: EFD EFD, Valvemate 7000 Controller Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: EFD EFD, 1500 XL Controller (1500 XL) Liquid / Epoxy Adhesive Dispenser Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Schroff PSM 115 Description: Power Supply unit Longdescription: Input: 230V (0,36A) Output: 15 V ( 2, Location : EUROPE (Western and Northern)

Price : On request

Keysight-Agilent 83731B The Keysight 83731B and 83732B synthesized signal generator sets a new standard for p Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight-Agilent E4360A This Solar Array Simulator mainframe is available for sale. The Agilent 1200W E4360A Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight-Agilent Z5623A The Z5623A series features a single connection to each port of the DUT and allows com Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight-Agilent 8510C Features: 45 MHz to 50 GHz / 110 GHz The fastest sweep mode available for any Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight-Agilent 8753ES Features 30 kHz to 3 or 6 GHz Up to 110 dB of dynamic range Excellent mea Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor Auto OmniMap RS-100 Resistivity Mapping System Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor M-Gage 300 with Allwin21 computer upgrade * Non-Contact Wafer Monitor for Sheet resistance. * Can acco Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA/Tencor P-20H Long Scan Profiler * Long Scan Profiler Measurement of vertical features ranging from 100 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: DEKTAK DEKTAK Model 8000 Surface profile 200 mm sample stage, 1A resolution at 65 kA, Windows interfa Location : AMERICA North (USA-Canada-Mexico)

Price : On request