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Used Inspection equipment

123 results
1

AOI Full size in-line PCB inspection worked very little, as new Multi-function system with top-down viewing Qu Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

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Desktop Type Vision Inspector PCB size range max 500 x 400 mm Machine dimensions 970 x 1130 x 472 mm Weight Location : EUROPE (Western and Northern)

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Inspection: Surfscan Location : ASIA (North East)

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<b>Brand: Vi Technology</b> <b>Model: 3D SPI In-line</b> <b>Year: 04/2008</b> <u><b>Solder Paste Inspection (A Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Inspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)

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Inspection: AOI Year(s) : 2010 Location : ASIA (North East)

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1

Camera system Spectro I-Lite 19 pixels Camera head with telecentric lens RAM upgrade to 2048 MB Siemens transp Year(s) : 2010 Location : EUROPE (Western and Northern)

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Camera system Spectro I-Lite 19 pixels Camera head with telecentric lens RAM upgrade to 2048 MB Siemens transp Year(s) : 2006 Location : EUROPE (Western and Northern)

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1

Auto X-Ray Inspection System Location : ASIA (North East)

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High Speed Soder Optical Visual Inspection System. Revised, ready to work. Available for immediate delivery. Year(s) : 2008 Location : EUROPE (Western and Northern)

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8

Flying Probe Tester SPEA 4040 Year 2000 Available for immediate delivery. Contact us for details: contact@elmo Year(s) : 2000 Location : EUROPE (Western and Northern)

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1

DESKTOP AOI Brand: SAKI Model: BF18D-P40 Year: 2007 Max board dimensions: 250 x 330 mm Circuit board thickn Year(s) : 2008 Location : EUROPE (Western and Northern)

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Features: Autoamtic optical inspection of PCB’s Inspects SMT & THT components (missing, type polarity Year(s) : 2007 Location : EUROPE (Western and Northern)

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1

3D Solder Paste Inspection 220V 1 Phase 50/60Hz Specifications ( See Details above for installed options ) Ko Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Description - Bare Wafer Surface Defect Inspection System - Max Wafer Capable: 8”/200mm - System configured fo Location : AMERICA North (USA-Canada-Mexico)

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SAM Bond Inspection System Location : AMERICA North (USA-Canada-Mexico)

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1

Inspection Model AOI 3D SQ3000 Location : EUROPE (Western and Northern)

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Tabletop 3D SPI 220v 1 phase Max. PCB Size 460 x 410 mm 18.11 x 16.14 inch KY-3020T uses the same patented 3D Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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DOM: 10/2012 Windows 7 OS Cameras: - 5 cameras all are 10MP (1 topdown x 4 side) Inteli-Beam Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Description: Colour Digital Camera based system with x10 Digital Zoom Illumination via 8W fluorescent Year(s) : 2007 Location : EUROPE (Western and Northern)

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Production Hours: Single shift production Description: High resolution in-line automatic optical inspection So Year(s) : 2007 Location : EUROPE (Western and Northern)

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0

SAKI inline AOI BF942 Good conditions or Sold as is good price Location : ASIA (China - Taiwan - HKG)

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Brand: Phoenix Phoenix inline AOI VSS-3C VPD-5CS Good conditions or Sold as is Good price Location : ASIA (China - Taiwan - HKG)

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Brand: Phoenix Phoenix inline AOI PA-500SB11 Good conditions Location : ASIA (China - Taiwan - HKG)

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Vi Technology AOI Vi3K Sold as is Good price Location : ASIA (China - Taiwan - HKG)

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You can find used Inspection equipment on Wotol

The main manufacturers of Inspection equipment are CyberOptics, KLA-Tencor, Saki, Agilent Technologies, Koh Young, Leica, Leitz, Nikon, Vi Technology, Crown, DS Semicon Co, Hitachi, MVP, NuTek, CyberOptics, Olympus, Photon Dynamics, Rudolph, Spea, YESTech.

The main model CG4000, HSSeries, 8160, IOI-6000 (SV6000), Cybersentry 2000, Ultra 1820, 4040 FLYING, REICHERT Polylite88, INM 20, Co DS-VIS, NSX-105c, SJ50 II XL, 5DX II, Flex Ultra HR, Vi3K, SE300 Ultra, VSS-3C, KY8020T, PA-500SB11, BF942, PA500SB11, S8030 Inline, V850L, LI-2000 , BF , MD-2000 , SE300 , BF942 , 7700 , SP1-TBI , ERGULUXSeries, MHL-525MS, KY8030-L, YTV-F1S, Surfscan 5000, NuTek NTM0501RCM-1000.

HS code 9031 41 00 For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices

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