Spectro iQ Energy Dispersive X-Ray Fluorescence (ED-XRF, EDXRF) Spectrometer

ULSD analysis capability: Sulfur Detection Limit < 1ppm
C-Force polarization optical system
to achieve new ultra-low limits of detection
for Na, Mg, Al, Si, P, S and Cl
Trace metals determination
Unique operation that guides the operator through
the analyzing process
The method wizard that allows simple adaptation
to new analysis tasks
Ready-to-use application packages that complies
to international standard
Low sulfur in fuels
Additives in oil
Cement
Slag
Ceramics and refractories